2011
DOI: 10.1007/s10853-011-5952-3
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Vibrational and AFM studies of adsorption of glycine on DLC and silicon-doped DLC

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Cited by 13 publications
(8 citation statements)
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“…The undoped DLC thin film showed a smooth and flat surface with the root mean square value (Rq) roughness around 1.97nm. This finding is similar to those obtained in our previous investigation [41]. nm, 4.1nm and 4.9 nm for S-1, S-2 and S-3, respectively.…”
Section: Atomic Force Microscopy (Afm) Analysissupporting
confidence: 93%
“…The undoped DLC thin film showed a smooth and flat surface with the root mean square value (Rq) roughness around 1.97nm. This finding is similar to those obtained in our previous investigation [41]. nm, 4.1nm and 4.9 nm for S-1, S-2 and S-3, respectively.…”
Section: Atomic Force Microscopy (Afm) Analysissupporting
confidence: 93%
“…The results of the XPS analysis of the O1s region of the Si-DLC samples showed that the oxygen concentration in the films increases with increasing silicon flow rate, ( Table 2). The obtained results are in good agreement with those provided previously determined values [11]. On the other hand, the band related to silicon atom (Si2p) appeared at around 101 eV.…”
Section: Surface Characterisation Of Prepared Samplessupporting
confidence: 92%
“…Comparative studies improved doped DLC possesses better surface biocompatibility than the undoped counterpart [8]. Thus, to enhance the biocompatibility of DLC, the incorporation of third element dopants like nitrogen [9], fluorine [10], silicon [11] and titanium [12], may be necessary.…”
Section: Introductionmentioning
confidence: 99%
“…5(b), the C 1s peak is tted by two peaks at about 283.97 and 284.79 eV, which are attributed to the Si-C and sp 2 C-C bonds, respectively. 27,28 For the O 1s peak, it is decomposed into two peaks at about 531.44 and 532.46 eV, respectively. The peak at $531.44 eV is related to the C]O bond while the peak at $532.46 eV is associated with the C-O-H and/or C-O-C bonds.…”
Section: Resultsmentioning
confidence: 99%