2012
DOI: 10.1364/ao.51.001431
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Vibration detection using focus analysis of interferograms

Abstract: This paper proposed an automated technique for vibration detection using statistical focus measure to evaluate interferogram contrast. An interferogram sequence from a Mach-Zehnder interferometer setup is recorded (frame rate: 24 fps) and the gray-level variance (GLVA) is plotted versus time. Occurrence of induced vibration in the setup causes a decrease in the interferogram contrast which, in turn, manifests as an evident rapid drop in the variance plot. The technique is demonstrated experimentally using peri… Show more

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Cited by 6 publications
(3 citation statements)
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References 21 publications
(25 reference statements)
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“…In terms of analysis tools, with the development of technology, the analysis tools are becoming more advanced and intelligent. From the complicated and functional single entity instruments to the virtual instruments developed with tools such as simulink, LAB-VIEW, MATLAB, etc., the functions are also more advanced [30,31,32].…”
Section: Figure 39 Cross-citation Network Of Related Literaturementioning
confidence: 99%
“…In terms of analysis tools, with the development of technology, the analysis tools are becoming more advanced and intelligent. From the complicated and functional single entity instruments to the virtual instruments developed with tools such as simulink, LAB-VIEW, MATLAB, etc., the functions are also more advanced [30,31,32].…”
Section: Figure 39 Cross-citation Network Of Related Literaturementioning
confidence: 99%
“…In terms of analysis tools, with the development of technology, analysis tools are becoming more advanced and intelligent. From the complicated and functional singleentity instruments to the virtual instruments developed with tools such as Simulink, LABVIEW, MATLAB, etc., the functions are also more advanced [33][34][35].…”
Section: Analysis Of the Current State Of Researchmentioning
confidence: 99%
“…Although the performance of the system does improve, the computational cost increases and the vertical resolution is the same as any other SFF system. Nevertheless, there have been previous works which include focus measures in interferometric setups for in-focus plane detection [16], for vibration detection [17], among other applications. Based on this idea, we propose a method that consists in applying a focus criterion in WLSI microscopy to achieve the best performance for surfaces with varying roughness and reflectivity.…”
Section: Introductionmentioning
confidence: 99%