2022
DOI: 10.1016/j.sse.2022.108364
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Versatile experimental setup for FTJ characterization

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Cited by 4 publications
(3 citation statements)
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“…1. An arbitrary waveform generator (AWG, Agilent 33250A) supplies V T at the MF metal electrode, while the current I F T J is measured at the virtual-grounded MD metal contact through an I→V converter [13]. The OPAMP (TI TL082CP) feedback loop defines the trans-impedance of the amplifier (V out =−R IV I F T J ) inside its bandwidth BW =(2πR IV C IV ) −1 .…”
Section: Experimental Setup and Resultsmentioning
confidence: 99%
“…1. An arbitrary waveform generator (AWG, Agilent 33250A) supplies V T at the MF metal electrode, while the current I F T J is measured at the virtual-grounded MD metal contact through an I→V converter [13]. The OPAMP (TI TL082CP) feedback loop defines the trans-impedance of the amplifier (V out =−R IV I F T J ) inside its bandwidth BW =(2πR IV C IV ) −1 .…”
Section: Experimental Setup and Resultsmentioning
confidence: 99%
“…3b. The reliability of our setup in measuring these quasi-static characteristics has been thoroughly assessed in [8], [9].…”
Section: Developed Experimental Setupmentioning
confidence: 99%
“…In this respect, we developed a versatile experimental setup (see Figs. 1 and 2) able to perform both quasi-static characterizations (large signals, LS, at low frequencies) [8], and conventional AC analyses (at medium-high frequencies) [9] of FTJs. Our versatile setup confirmed the quantitative disagreement between the LS and AC responses of the FTJs and, for this reason, in this work we have made extensive use of the new electrical characterization procedure first presented in [9], providing a bridge between the LS and AC experiments.…”
Section: Introductionmentioning
confidence: 99%