2015
DOI: 10.1063/1.4922770
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Variability and reliability analysis in self-assembled multichannel carbon nanotube field-effect transistors

Abstract: Park, H. (2015). Variability and reliability analysis in self-assembled multichannel carbon nanotube field-effect transistors.

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Cited by 13 publications
(8 citation statements)
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“…As expected, the connection yield for the composite devices increases with the number of trenches. In addition, there is a beneficial effect of averaging on the distribution of the V t variation, as shown in Figure C . Moreover, V t variation is also found to be similar to that of devices made by using polyfluorene-sorted CNTs …”
Section: Resultssupporting
confidence: 57%
“…As expected, the connection yield for the composite devices increases with the number of trenches. In addition, there is a beneficial effect of averaging on the distribution of the V t variation, as shown in Figure C . Moreover, V t variation is also found to be similar to that of devices made by using polyfluorene-sorted CNTs …”
Section: Resultssupporting
confidence: 57%
“…CNTs are basically nano-scaled tubes formed by the rolled sheets of graphite and possess high tensile strength, high electrical conductivity and excellent chemical stability [35]. CNTs are the smallest-scale nano-materials that can be observed only by a transmission electron microscope (TEM) [36,37]. CNTs are classified as either single-walled (SWCNT), which consist of a single nanotube, or multi-walled (MWCNT), which are made up of multiple nanotubes with inter-layer spacing of 0.34 nm.…”
Section: A Brief On Carbon Nanotube Field Effect Transistors (Cntfets)mentioning
confidence: 99%
“…orientation comprising carbon atoms from only one sub-lattice of the bipartite hexagonal lattice are predicted to host magnetic order [6,7]. Carbon nanotubes attracted much attention due to its possible applications for nanoscale electronic devices [8,9] like ballistic transport [10][11][12], high-performance field-effect transistors [13][14][15][16][17] and logic devices [18][19][20][21][22][23].…”
Section: Introductionmentioning
confidence: 99%