Validation of a method for the determination of boron in ceramic materials by X-ray fluorescence spectrometry

Sánchez-Ramos, S.; Bosch‐Reig, F.; Gimeno-Adelantado, José Vicente; Marco, Dolores Julia Yusá; Doménech‐Carbó, Antonio; Berja-Pérez, J.A

doi:10.1016/s0584-8547(00)00267-6

Cited by 16 publications

(8 citation statements)

References 11 publications

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“…Specific limitations of XRF spectrometry regarding the determination of low atomic number elements are well known and documented . Nevertheless, it seems to be generally accepted that state‐of‐the‐art XRF spectrometers can be applied for quantitative analyses of fluorine and even boron . Apart from reports in scientific journals, also leading WD‐XRF instrument manufacturers suggest that quantification of boron, fluorine and chlorine is possible at least without major restrictions.…”

Section: Introductionmentioning

confidence: 99%

X‐ray‐induced alteration of specimens as crucial obstacle in XRF spectrometry of fluorine in rocks and soils

Pleßow

2012

X-Ray Spectrometry

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Occasionally suggested yet rarely performed X-ray fluorescence (XRF) spectrometry of fluorine seems to fail systematically in yielding reliable quantitative results for rocks and soils. Repeated analyses reveal continuously drifting fluorescence intensities for fluorine, boron and chlorine. Typically, an increase, but in few cases also a decrease, over X-ray exposure time is observed. For instance, fluorine concentrations in a soil standard appear to increase steadily from below the detection limit in the first run to nearly 850 mg/kg F more than 10 h later in the last. In contrast, cryolite is characterised by drastically decreasing intensities for fluorine. Although fluorescence intensities may be affected by preparation methods, specimen surface conditions and dynamic contamination, it is shown that none of these influencing factors is responsible for the observed trends. In fact, there is evidence that X-radiation impact mobilises fluorine, boron and chlorine. Diffusion of radiolysis products towards the specimen's surface as well as the kinetics of adsorption and desorption or chemical reactions are believed to control the analyte concentration in the analysed layer decisively. Furthermore, during analysis, the latter is altered by considerable losses of binder or fluxif applicable thus enhancing XRF intensities of boron and fluorine because of reduced absorption. In any case, signal stability appears to be limited by insufficient sample and specimen stability. It is concluded that for many soil and rock samples, XRF spectrometry is inappropriate to quantify fluorine, although the crucial obstacle is neither the analytical method nor the spectrometer sensu strictu.

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Section: Introductionmentioning

confidence: 99%

X‐ray‐induced alteration of specimens as crucial obstacle in XRF spectrometry of fluorine in rocks and soils

Pleßow

2012

X-Ray Spectrometry

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“…Practical methods for the analysis of refractory oxide materials by XRF continue to be published. These have included: the use of JRRM reference materials (Technical Association of Refractories, Japan) for the analysis of spinels 327 and refractories containing zirconia; 328 a chemical validation of a method for the XRF determination of B in ceramics and boracic raw materials; 329 and sample preparation re ´gimes for the determination of the composition of aluminachrome refractories. 330 The advantages of XRF in comparison with ICP-AES for the detection of P in ceramics were illustrated by Marina and Lopez.…”

Section: Industrialmentioning

confidence: 99%

Atomic Spectrometry Update. X-ray fluorescence spectrometry

Potts

Ellis

Kregsamer³

et al. 2001

J. Anal. At. Spectrom.

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Reviews 2 Instrumentation 2.1 General instrumentation and excitation sources 2.2 Detectors 3 Spectrum evaluation, matrix correction and calibration procedures 3.1 Spectrum evaluation 3.2 Matrix correction and calibration procedures 4 X-ray optics 5 Synchrotron radiation 6 Total reflection X-ray fluorescence spectrometry (TXRF) 7 Portable and mobile XRF 8 On-line XRF 9 Applications 9.1 Sample preparation 9.2 Preconcentration techniques 9.3 Geological 9.4 Environmental 9.5 Archaeological and forensic 9.6 Industrial 9.7 Clinical and biological 9.8 Thin films 9.9 Chemical state analysis and speciationThis annual review of X-ray fluorescence covers developments over the period 2000-2001 in instrumentation and detectors, matrix correction and spectrum analysis software, X-ray optics and microfluorescence, synchrotron XRF, TXRF, portable XRF and on-line applications as assessed from the published literature. The review also covers a survey of applications, including sample preparation, geological, environmental, archaeological, forensic, biological, clinical, thin films, chemical state and speciation studies. During the current review period, publications have demonstrated the development of sub-100 nm X-ray beams for SR microprobe analysis together with the wider use of WD spectrometers in this application. There is evidence of an extension of the application of XRF as a reference technique, with XRF increasingly being used in modern laboratories in place of older wet-chemical methods, and computer-modelling studies continue to be popular in extending the understanding of various XRF phenomena. Some interesting work has been undertaken in the measurement of radiative Auger effects using high-resolution WDXRF instruments. However, the potential for future developments in XRF is illustrated by research into ultra-high resolution microcalorimeter detector devices, which are still at the experimental stage and have not yet progressed to the status of useful practical devices.

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“…Thus, the determination of boron in plants is becoming increasingly important, especially in agriculture. In literatures, a number of the methods have been reported to determination of boron such as atomic absorption spectrometry (AAS) [2], inductively coupled plasma atomic emission spectrometry (ICP-AES) [3][4][5][6], inductively coupled plasma optical emission spectrometry 0039 (ICP-OES) [7], the prompt-␥ method [8], inductively coupled plasma mass spectrometry (ICP-MS) [9], electrochemical method [10], X-ray fluorescence spectrometry (XFS) [11] and spectrophotometry [12]. Among these, AAS has remained limited because these methods have poor sensitivity and suffer from serious memory effects and interferences.…”

Section: Introductionmentioning

confidence: 99%

1-(2,3,4-Trihydroxybenzylideneamino)-8-hydroxynaphthalene-3,6-disulfonic acid as reagent for spectrophotometric determination of boron in plants

Song

Cui

et al. 2005

Talanta

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Validation of a method for the determination of boron in ceramic materials by X-ray fluorescence spectrometry

Cited by 16 publications

References 11 publications

X‐ray‐induced alteration of specimens as crucial obstacle in XRF spectrometry of fluorine in rocks and soils

X‐ray‐induced alteration of specimens as crucial obstacle in XRF spectrometry of fluorine in rocks and soils

Atomic Spectrometry Update. X-ray fluorescence spectrometry

1-(2,3,4-Trihydroxybenzylideneamino)-8-hydroxynaphthalene-3,6-disulfonic acid as reagent for spectrophotometric determination of boron in plants

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