2012
DOI: 10.1186/1556-276x-7-562
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Valence band offset of β-Ga2O3/wurtzite GaN heterostructure measured by X-ray photoelectron spectroscopy

Abstract: A sample of the β-Ga2O3/wurtzite GaN heterostructure has been grown by dry thermal oxidation of GaN on a sapphire substrate. X-ray diffraction measurements show that the β-Ga2O3 layer was formed epitaxially on GaN. The valence band offset of the β-Ga2O3/wurtzite GaN heterostructure is measured by X-ray photoelectron spectroscopy. It is demonstrated that the valence band of the β-Ga2O3/GaN structure is 1.40 ± 0.08 eV.

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Cited by 114 publications
(63 citation statements)
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“…Note that the lower Ga surface versus bulk content for the m-Ga 2 O 3 reference reflects oxygen termination of gallium surfaces [57]. O 1s XP spectra of HZSM-5 revealed a single broad peak with a 533 eV binding energy associated with Si-O-Si and Si-O-Al environments [58,59] (Figure 3a), which was unaffected by low levels of Ga doping, but shifted to lower binding energy for 10Ga/HZSM-5, approaching that of Ga 2 O 3 at 530.7 eV [60,61]. A similar trend was observed for the Ga 2p 3/2 XP spectra (Figure 3b), which exhibited a single broad peak at 1119.0 eV for low Ga loadings, whose binding energy decreased towards that of m-Ga 2 O 3 at 1117.9 eV for 10Ga/HZSM-5 [62].…”
Section: Crystallitementioning
confidence: 99%
“…Note that the lower Ga surface versus bulk content for the m-Ga 2 O 3 reference reflects oxygen termination of gallium surfaces [57]. O 1s XP spectra of HZSM-5 revealed a single broad peak with a 533 eV binding energy associated with Si-O-Si and Si-O-Al environments [58,59] (Figure 3a), which was unaffected by low levels of Ga doping, but shifted to lower binding energy for 10Ga/HZSM-5, approaching that of Ga 2 O 3 at 530.7 eV [60,61]. A similar trend was observed for the Ga 2p 3/2 XP spectra (Figure 3b), which exhibited a single broad peak at 1119.0 eV for low Ga loadings, whose binding energy decreased towards that of m-Ga 2 O 3 at 1117.9 eV for 10Ga/HZSM-5 [62].…”
Section: Crystallitementioning
confidence: 99%
“…The frequent occurrence of the (−201) peak on the surface of the oxidised GaN is another reason that stimulates the study of the interface between this facet and water ,. GaN‐based sensor technologies have been investigated extensively to detect gas, pH, biochemicals and various ions in solution .…”
Section: Introductionmentioning
confidence: 99%
“…(d), the high‐resolution XPS of O 1s can be also fitted with three chemical states at binding energies of 530.7 eV, 532.2 eV and 533.8 eV. The deconvoluted peaks close to 531 eV and around 532 eV represent Ga―O bond and Al―O bond, respectively, which indicates that O contamination mainly exists in the form of oxide. In Fig.…”
Section: Resultsmentioning
confidence: 99%