Ultrafast-response (20 μs) UV detectors, which are visible-blind and self-powered, in devices where an n-type ZnO nanowire partially lies on a p-type GaN film, are demonstrated. Moreover, a CdSe-nanowire red-light detector powered by a nanoscale ZnO/GaN photovoltaic cell is also demonstrated, which extends the device function to a selective multiwavelength photodetector and shows the function of an optical logical AND gate.

We first report AlGaN-based deep ultraviolet light-emitting diodes (UV-LEDs) grown on nano-patterned sapphire substrates (NPSS) prepared through a nanosphere lithography technique. The AlN coalescence thickness on NPSS is only 3 μm due to AlN's nano-scaled lateral growth, which also leads to low dislocation densities in AlN and epi-layers above. On NPSS, the light-output power of a 282-nm UV-LED reaches 3.03 mW at 20 mA with external quantum efficiency of 3.45%, exhibiting 98% better performance than that on flat sapphire. Temperature-dependent photoluminescence reveals this significant enhancement to be a combination of higher internal quantum efficiency and higher light extraction efficiency.

We report epitaxial growth of AlN films with atomically flat surface on nano-patterned sapphire substrates (NPSS) prepared by nano-imprint lithography. The crystalline quality can be greatly improved by using the optimized 1-μm-period NPSS. The X-ray diffraction ω-scan full width at half maximum values for (0002) and (102) reflections are 171 and 205 arcsec, respectively. The optimized NPSS contribute to eliminating almost entirely the threading dislocations (TDs) originating from the AlN/sapphire interface via bending the dislocations by image force from the void sidewalls before coalescence. In addition, reducing the misorientations of the adjacent regions during coalescence adopting the low lateral growth rate is also essential for decreasing TDs in the upper AlN epilayer.

which are environmentally friendly and enable portability and high efficiency. Up to date, great progress has been made on the UVC light-emitting diodes (LEDs) by using active regions of AlGaN multiple quantum wells (MQWs) .[8-14] However, the optical output power of current UVC LEDs drops significantly as the light emission wavelength gets shorter. Those LEDs suffer from poor hole injection efficiency in high-Al-content p-type AlGaN, low internal quantum efficiency (IQE) caused by large-lattice-mismatch heteroepitaxy, and strong quantum-confined Stark effect (QCSE), as well as the absorption by the nontransparent GaN contact layers. [15][16][17] A promising approach that dramatically improves the light output power is electron-beam (e-beam) pumping, especially for the short-wavelength UVC spectral range. [3,[18][19][20][21][22][23][24] This approach allows one to bypass the need for p-type or n-type injection layers and, thus, can largely increase the carrier injection efficiency. This provides a unique advantage over conventional LEDs at UVC range, since the p-type doping for high-Al-content AlGaN is High-output-power electron-beam (e-beam) pumped deep ultraviolet (DUV) light sources, operating at 230-270 nm, are achieved by adjusting the well thickness of binary ultrathin GaN/AlN multiple quantum wells. These structures are fabricated on high-quality thermally annealed AlN templates by metal-organic chemical vapor deposition. Owing to the reduced dislocation density, large electron-hole overlap, and efficient carrier injection by e-beam, the DUV light sources demonstrate high output powers of 24.8, 122.5, and 178.8 mW at central wavelengths of 232, 244, and 267 nm, respectively. Further growth optimization and employing an e-gun with increased beam current lead to a record output power of ≈2.2 W at emission wavelength of ≈260 nm, the key wavelength for water sterilization. This work manifests the practical levels of high-output-power DUV light sources operated by using e-beam pumping method. The ORCID identification number(s) for the author(s) of this article can be found under https://doi.org/10.1002/adom.201801763.Solid-state deep ultraviolet (DUV) optoelectronic devices in the spectral range of 200-280 nm, i.e., ultraviolet-C (UVC), have attracted much attention for their wide applications in sterilization, medical treatment, security, solar-blind photodetection, and so on. [1][2][3][4][5][6][7] Currently, Al(Ga)N material system is the most promising candidate for solid-state UVC light sources

Quasi-2D GaN layers inserted in an AlGaN matrix are proposed as a novel active region to develop a high-output-power UV light source. Such a structure is successfully achieved by precise control in molecular beam epitaxy and shows an amazing output power of ≈160 mW at 285 nm with a pulsed electron-beam excitation. This device is promising and competitive in non-line-of-sight communications or the sterilization field.