2016
DOI: 10.1063/1.4959010
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UV-VUV synchrotron radiation spectroscopy of NiWO4

Abstract: Photoluminescence and excitation spectra of microcrystalline and nanocrystalline nickel tungstate (NiWO 4 ) were measured using UV-VUV synchrotron radiation source. The origin of the bands is interpreted using comparative analysis with isostructural ZnWO 4 tungstate and based on the results of recent first-principles band structure calculations. The influence of the local atomic structure relaxation and of Ni 2+ intra-ion d-d transitions on the photoluminescence band intensity are discussed.

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Cited by 17 publications
(11 citation statements)
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“…At the end, we note that this article is another example of the use of synchrotron radiation, which we have used in our previous papers for study of the VUV spectroscopic properties of NiWO 4 [37,38].…”
Section: Synchrotron-based Far-infrared Spectroscopy Of Nickel Tungstatementioning
confidence: 96%
“…At the end, we note that this article is another example of the use of synchrotron radiation, which we have used in our previous papers for study of the VUV spectroscopic properties of NiWO 4 [37,38].…”
Section: Synchrotron-based Far-infrared Spectroscopy Of Nickel Tungstatementioning
confidence: 96%
“…Molybdates and tungstates find a wide range of practical applications due to their ability to adopt different crystallographic structures, whose physical properties can be further modified by a chemical composition [1,2]. In particular, these materials are used as scintillators, down-conversion phosphors, white light-emitting diodes, laser host materials, catalysts, sensors and pigments [3][4][5][6][7][8][9][10][11][12].…”
Section: Introductionmentioning
confidence: 99%
“…The sample with 10% samarium concentration revealed a small fraction of additional monoclinic SmB 3 O 6 phase (ICDD#04-010-0838) [9]. Synchrotron radiation has been successfully applied for luminescence studies of many types of wide band gap inorganic materials in UV and VUV spectral ranges [37][38][39][40][41][42][43], including nanocrystalline semiconductor structures [44,45] and two-dimensional systems [46][47][48].…”
Section: Methodsmentioning
confidence: 99%