2016 IEEE 59th International Midwest Symposium on Circuits and Systems (MWSCAS) 2016
DOI: 10.1109/mwscas.2016.7870068
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Using scattering parameters and the g<inf>m</inf>/I<inf>D</inf> MOST ratio for characterisation and design of RF circuits

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Cited by 3 publications
(2 citation statements)
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“…Electronics 2020, 9, x FOR PEER REVIEW 6 of 17 Figure 6 summarizes the procedure for obtaining the circuit's S-parameters as a function of the physical properties of the transistor. A validation of these relations can be found in [29], where this strategy was applied to the characterization of an LNA common source stage, and concurrent simulations with the ACM and IBM BSIM4 MOS 65 nm models were performed.…”
Section: Parameter Expressionmentioning
confidence: 99%
See 1 more Smart Citation
“…Electronics 2020, 9, x FOR PEER REVIEW 6 of 17 Figure 6 summarizes the procedure for obtaining the circuit's S-parameters as a function of the physical properties of the transistor. A validation of these relations can be found in [29], where this strategy was applied to the characterization of an LNA common source stage, and concurrent simulations with the ACM and IBM BSIM4 MOS 65 nm models were performed.…”
Section: Parameter Expressionmentioning
confidence: 99%
“…The characterization of an LNA common source (CS) stage in terms of the S-parameters, the gm/I D ratio and the transistor's size, was introduced for the first time in [29]. In [30], this approach is extended to the whole design of an LNA.…”
Section: Introductionmentioning
confidence: 99%