2004
DOI: 10.1109/tim.2003.822703
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Using Data Compression in Automatic Test Equipment for System-on-Chip Testing

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Cited by 13 publications
(3 citation statements)
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“…The output of response comparison unit is Test Pass/Fail flag (shown in Fig. 7), this response compression reduces ATE storage [31].…”
Section: Fault Localization With Proposed Methodsmentioning
confidence: 99%
“…The output of response comparison unit is Test Pass/Fail flag (shown in Fig. 7), this response compression reduces ATE storage [31].…”
Section: Fault Localization With Proposed Methodsmentioning
confidence: 99%
“…A technique for less storage on ATE environment for compression has been presented in [15] in which a maximal set of reusable segments in the test data is found and then compressed. The practical problems of once existing test data compression technique is addressed in [16] and to reduce the ATE storage requirement, a columnwise processing of test data is proposed in [16].…”
Section: B Reordering Of Test Vectorsmentioning
confidence: 99%
“…Since correlations between test vectors are usually high, due to the circuit structure dependency, test vector correlation is exploited to minimize the bit flips or the replacement words between consequent test patterns [7,8,9,10,11]. Furthermore, don't care bits in test patterns can also be exploited to further improve compression efficiency.…”
Section: Correlation-relatedmentioning
confidence: 99%