2014 Proceedings of the 21st International Conference Mixed Design of Integrated Circuits and Systems (MIXDES) 2014
DOI: 10.1109/mixdes.2014.6872217
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Usefulness of VeSTIC devices for low-noise and radiation hard 3D integrated circuits

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Cited by 3 publications
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“…The first prototype wafer did not contain bipolar transistors, and it was used for experiments with unipolar junction field effect transistor VES-JFET [24], as well as for measurements of basic parameters such as resistances, capacitances, etc. The second wafer contained p-n-p bipolar transistors.…”
Section: Measurementsmentioning
confidence: 99%
“…The first prototype wafer did not contain bipolar transistors, and it was used for experiments with unipolar junction field effect transistor VES-JFET [24], as well as for measurements of basic parameters such as resistances, capacitances, etc. The second wafer contained p-n-p bipolar transistors.…”
Section: Measurementsmentioning
confidence: 99%