1999
DOI: 10.1109/66.806129
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Use of voltage stressing at wafer probe for reliability predictions

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Cited by 5 publications
(1 citation statement)
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“…Manufacturing profitability can be affected by the performance of electronic components such as microcontrollers [1]. A microcontroller is a highly integrated computer system on a chip.…”
Section: Introductionmentioning
confidence: 99%