Use of layered synthetic microstructures for the quantitative x-ray analysis of light elements

Hombourger, Chrystel; Jonnard, Philippe; André, Jean‐Michel; Chauvineau, J.P.

doi:10.1002/(sici)1097-4539(199905/06)28:3<163::aid-xrs331>3.0.co;2-z

Cited by 19 publications

(10 citation statements)

References 14 publications

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“…Let us recall that in the vicinity of an absorption egde of an element constituting an x-ray reflector (here boron in an La/B 4 C multilayer mirror), anomalous x-ray scattering by this element occurs, giving rise to troublesome structures in the reflection. 10,11 CONCLUSION La/B 4 C MIMs with small period for the WDXRF detection of boron at a Bragg angle of 45°have been produced and successfully tested. They offer performances similar to those of larger period La/B 4 C MIMs developed to detect boron at a lower Bragg angle.…”

Section: Spectroscopic Applicationsmentioning

confidence: 99%

La/B4C small period multilayer interferential mirror for the analysis of boron

André

Jonnard

Michaelsen³

et al. 2005

X-Ray Spectrom.

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An La/B 4 C multilayer interferential mirror with small period d (4.8 nm) was produced by diode sputtering for the detection of the boron K emission by wavelength-dispersive x-ray spectrometry at a large Bragg angle (close to 45 • ). The structure of the mirror was characterized by grazing incidence x-ray reflectometry and its performance at the energy of the boron K emission (183 eV) was evaluated by means of polarized synchrotron radiation. Spectrometric measurements showed that the La/B 4 C mirror improved the detection limit of boron using by a factor of 2 with respect to similar Mo/B 4 C mirrors and by a factor of 4 with respect to a lead stearate crystal.

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Section: Spectroscopic Applicationsmentioning

confidence: 99%

La/B4C small period multilayer interferential mirror for the analysis of boron

André

Jonnard

Michaelsen³

et al. 2005

X-Ray Spectrom.

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“…Indeed, no crystal can operate in this range owing to the long wavelength to disperse. Thus, such spectroscopy requires the use of a grating spectrometer 9 or of a crystal spectrometer equipped with a suitable periodic multilayer [10][11][12][13] . However, the low fluorescence yield of nitrogen combined to the low reflectance of grating and multilayers makes the study of this spectral range difficult.…”

Section: Introductionmentioning

confidence: 99%

Characterization of Sc/Mg multilayers with and without Co barriers layers for x-ray spectroscopy in the water window range

Jonnard

Guen

et al. 2019

Journal of Applied Physics

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We characterize nano-scale periodic Sc/Mg two-layer, Sc/Mg/Co tri-layers and Sc/Co/Mg/Co quadri-layer designed as dispersive elements for x-ray spectroscopy in the nitrogen K range (390 eV). The samples are prepared by magnetron sputtering with Mg and Sc layers being a few nanometers thick and Co layers being of sub-nanometric thickness. We apply nondestructive (x-ray reflectivity and x-ray fluorescence in standing wave mode) and destructive (transmission electron microscopy) techniques to obtain a relevant description of the deposited stacks. It turns out that a strong interdiffusion takes place in the two-layer leading to poor reflective properties. Interdiffusion also occurs in the tri-layers and quadri-layer but between the Sc and Co layers. These systems can be considered as periodic ScCo/Mg two-layers with well-defined layers. As a consequence, the Sc/Co/Mg/Co multilayer is found interesting to use for spectroscopy as a reflectance of 32% is expected in the N K range in the water window range.

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“…[1][2][3][4][5] They have also been used as monochromators in soft-x-ray reflectometers. 6,7 Compared with Langmuir-Blodgett soapfilm monochromators, MIMs present numerous advantages:…”

Section: Introductionmentioning

confidence: 99%

X-ray multilayer monochromator with enhanced performance

André¹,

Benbalagh²,

Barchewitz³

et al. 2002

Appl. Opt.

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An x-ray multilayer monochromator with improved resolution and a low specular background is presented. The monochromator consists of a lamellar multilayer amplitude grating with appropriate parameters used at the zeroth diffraction order. The device is fabricated by means of combining deposition of thin films on a nanometer scale, UV lithography, and reactive ion etching. The performance of this new monochromator at photon energies near 1500 eV is shown.

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Use of layered synthetic microstructures for the quantitative x-ray analysis of light elements

Cited by 19 publications

References 14 publications

La/B4C small period multilayer interferential mirror for the analysis of boron

La/B4C small period multilayer interferential mirror for the analysis of boron

Characterization of Sc/Mg multilayers with and without Co barriers layers for x-ray spectroscopy in the water window range

X-ray multilayer monochromator with enhanced performance

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