Usage of the Fiber Plate Image Orthicon for Quick Video Recording of Electron Microscopic Images

Abstract

I consider the spectral sensitivities and bandwidths, in the standard quantum limit, of the narrowband spherical detectors, which would evolve from the present bar detectors and the wideband novel 'dual' detectors that have been proposed recently. If appropriate advanced fabrication and read-out technologies are developed, both kinds of GW acoustic detectors would play a relevant role in the near-kHz frequency region.

Ultra‐high voltage electron microscopy: Past, present, and future

“…(k) Image recording, analysis, and processing systems (Saxton, 1978): Image analysis is important for correction of image aberrations and for the Fourier analysis of diffracted waves distributing in three-dimensional space as for X-rays. Image intensifiers (Imura et al, 1969(Imura et al, , 1971) and differential analysis of image contrast are also important for very rapid recording, such as stroboscopic recording, of the EM images. Where image analysis and image processing are effectively combined with each other, the voltage dependence of the maximum observable specimen thickness increases more than that shown in Figure 8.…”

Stimulation of use of in-situ experiments in high voltage electron microscopes in advancing science and technology

“…In 1967, a TV-VTR system was introduced to HVEM in-situ experiments for the first time as an image recording system by our Nagoya group [4,[14][15][16] and continuous fast recording by this system of the images of dislocations moving under a controlled stress-strain condition was initiated [4,6,7,17] [6,7,17,18]. Of course, some size effects may be found, so that absolute values of load and elongation measured with a thin specimen may differ somewhat from those measured with bulky specimens and the accuracy of the measurement of cross-sectional area of the specimen for obtaining the applied stress is not so high as compared with bulky specimens, but even so, the technique described in the references [5] and [6] is good enough to mâke a direct correlation between the moving dislocation and the stress-strain state of the specimen with a reasonable accuracy.…”