2020
DOI: 10.1134/s002044122005036x
|View full text |Cite
|
Sign up to set email alerts
|

Upgrading the Scanning Two-Dimensional Ionization Profile Monitor in Beam Transport Lines

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
2
0

Year Published

2023
2023
2023
2023

Publication Types

Select...
2

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
(2 citation statements)
references
References 7 publications
0
2
0
Order By: Relevance
“…The monitor of a more advanced design described in [23] operating on the same principle of electric field scanning reported in [22] was subjected to modernization and involves using MCPs.…”
Section: Ipm Operation Principle For Measuring Two-dimensional Detail...mentioning
confidence: 99%
“…The monitor of a more advanced design described in [23] operating on the same principle of electric field scanning reported in [22] was subjected to modernization and involves using MCPs.…”
Section: Ipm Operation Principle For Measuring Two-dimensional Detail...mentioning
confidence: 99%
“…The monitor of a more advanced design described in [23] operating on the same principle of electric field scanning reported in [22] was subjected to modernization and involves using MCPs.…”
Section: Ipm Operation Principle For Measuring Two-dimensional Detail...mentioning
confidence: 99%