Abstract:<p>An IPM monitor to measure a detailed profile of the beam has been developed and constructed. The monitor was developed in the course of modernization of the structure operating on the basis of electric field scanning. The monitor also consists of an extractor, a scanner and two electrostatic analyzers in series. A system to control the monitor and process the data has been developed and produced. As a result of performance testing of the monitor it is established that it allows detailed measurements o… Show more
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