2014
DOI: 10.1016/j.tsf.2014.02.063
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Upgrading the “Berg-model” for reactive sputtering processes

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Cited by 83 publications
(68 citation statements)
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“…this commonly reported behavior is associated with the oxidation and reduction of the sputter target surface as reactive gas content is varied [55][56][57][60][61][62]. At Q O2 values near 5 sccm and above, P O2 increases linearly at a rate proportional to the pumping speed of the system.…”
Section: Accepted Manuscriptmentioning
confidence: 90%
See 1 more Smart Citation
“…this commonly reported behavior is associated with the oxidation and reduction of the sputter target surface as reactive gas content is varied [55][56][57][60][61][62]. At Q O2 values near 5 sccm and above, P O2 increases linearly at a rate proportional to the pumping speed of the system.…”
Section: Accepted Manuscriptmentioning
confidence: 90%
“…MPPMS was used due to its ability to generate high target power densities, allowing for rapid reduction of oxygen on the surface of the "oxygen poisoned" molybdenum cathode, as well as for its highly metallic plasma resulting in increased oxygengettering capability [50][51][52][53]. Therefore, fine adjustments in the applied MPPMS power should be able to accurately control the oxygen partial pressure within the deposition chamber via chemisorption [50,[54][55][56][57].…”
Section: Introductionmentioning
confidence: 99%
“…Simulations and modelling of the reactive sputtering deposition processes using two reactive gases have shown that the deposition process response is unlike that one found when only one reactive gas is used [20]. Both reactive gases compete during compound formation, both on the target and on the substrate, which implies that both reactive gases contribute to the target poisoning effect.…”
Section: Deposition Rate and Film Compositionmentioning
confidence: 95%
“…Part of the vapor is ionized and there is a high partial pressure of inert sputtering gas. While the reactive sputtering process is on a global level rather well understood [19,20], there is no theory available that describes (off-) stoichiometry, that is, the nitrogen-to-metal ratio N/M of the thin film.…”
Section: Contactmentioning
confidence: 99%