Upgrading of the ultra-clean injector for depth profiling at the Munich AMS facility

AMS with light nuclei at small accelerators

“…Certainly, if the sputter beam would have a cylindrical shape such effect will not occur. A solution to avoid the crater rim effect is to move the target-sample in front of the Cs + -sputter ion beam and to scan it over a wide surface, in a raster pattern over a square area and select for extraction and analyses only the ions sputtered from the flat bottom [28,29]. Figure 5(b) shows what happens if the crater rim effect is not extracted: peak structures can be hidden.…”

“…In the following we will present some original results of applications in the fusion energy industry. AMS-DP and the Full Combustion Method (FCM) are the only methods today able measuring surface and bulk tritium distributions in fusion experiments [29][30][31]. All efforts are directed today for finalizing the first International Thermonuclear Experimental Reactor (ITER) at Cadarache France.…”

Atomic spectrometry update. Atomic mass spectrometry

“…18 The Munich facilities' ultra-clean ion injector has been upgraded for depth profiling. 19 This required sputter erosion on the target to be uniform and sputter ions from the crater walls to be excluded from analysis. The central part of the reconstruction work involved the stepwise movement of the target in two directions perpendicular to the Cs sputter ion beam.…”

Unfolding procedure for AMS depth profiling

“…Depth profiling of the material concentration in samples is commonly performed with secondary ion mass spectrometry (SIMS). Recently, it has also been performed with accelerator mass spectrometry (AMS) [1][2][3][4][5]. Independently of the employed method, the depth resolution depends on flat bottom craters produced by the sputter ion beam.…”

“…In AMS, the applied solutions are moving the target or the target holder in front of the Cs + -sputter ion beam [5]. Similar to SIMS, in order to avoid crater edge effects, when the Cs + ion beam is sputtering on the crater walls, the data acquisition system ignores the secondary ions.…”