Updated database for L x‐ray production by protons and extraction of L‐subshell ionization cross sections from only Lγ and Lα + Lβ cross sections

Lapicki, G.; Miranda, J.

doi:10.1002/xrs.1303

Cited by 7 publications

(2 citation statements)

References 40 publications

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“…Semiempirical models for the calculation of the probability of K-shell ionisation have been established by Helmut Paul and co-workers [138]. L-shell ionisation has been similarly determined by Miguel Reis and co-workers [139] with a polynomial representation for both K-and L-shells [140] and sub-shell ionisation cross-sections also extracted from the data [141]. Reliable data for M-shell ionisation is not currently available in the same form, but Fig.23 shows working values obtained by interpolation and extrapolation from ECPSSR XI calculations (Campbell et al [142]).…”

Section: Ionisation Cross-sectionmentioning

confidence: 99%

Ion Beam Analysis: A Century of Exploiting the Electronic and Nuclear Structure of the Atom for Materials Characterisation

Jeynes

Webb

Lohstroh

2011

Rev. Accl. Sci. Tech.

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Analysis using MeV ion beams is a thin film characterisation technique invented some 50 years ago which has recently had the benefit of a number of important advances. This review will cover damage profiling in crystals including studies of defects in semiconductors, surface studies, and depth profiling with sputtering. But it will concentrate on thin film depth profiling using Rutherford backscattering, particle induced X-ray emission and related techniques in the deliberately synergistic way that has only recently become possible. In this review of these new developments, we will show how this integrated approach, which we might call “total IBA”, has given the technique great analytical power

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Section: Ionisation Cross-sectionmentioning

confidence: 99%

Ion Beam Analysis: A Century of Exploiting the Electronic and Nuclear Structure of the Atom for Materials Characterisation

Jeynes

Webb

Lohstroh

2011

Rev. Accl. Sci. Tech.

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“…Although IS coupling corrections were originally calculated using a database of x-ray production cross-sections (XRPCS) by 4 He ion impact [5], recent works emphasize the need for updated compilations [7,8]. Therefore, this work presents an evaluation of published experimental XRPCS after 4 He + ion impact on several elements with atomic number Z 2 between 46 and 92.…”

Section: Introductionmentioning

confidence: 99%

Evaluation of L-shell X-ray production cross sections by impact of [sup 4]He[sup +] ions

Miranda¹

2013

AIP Conference Proceedings

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Atomic Excitation Exploited By Energetic‐Beam Characterization Methods

Jeynes

Grime

2012

Characterization of Materials

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Many disparate methods of compositional analysis of materials are underpinned by the same fundamental atomic processes: the excitation of the electronic system of the atoms followed by its subsequent relaxation. These methods include the electron spectroscopies (XPS, AES) used for surface studies, the electron microscopies used for elemental and structural characterization (SEM using EDS and WDX; TEM using EELS), and the X‐ray methods (XRF, XAS) and ion beam analysis (PIXE) used for elemental and chemical characterization. All rely on measuring the characteristic energy absorbed or emitted by the unknown target atom when its electronic system is excited by ionization due to charged particles or electromagnetic radiation. This excitation is defined by the energy levels of the atomic electrons, determined primarily by the atomic number of the atom. (Atoms can also be excited without ionization, as in optical and infrared spectroscopy: this is outside the scope of this article.) The theoretical description of the electronic structure of atoms is a major intellectual triumph of the twentieth century and this body of knowledge is exploited in the theoretical description of each of these methods, but the treatment of any particular method is usually presented by specialists in that method in isolation from all others. In this article we present a brief synthetic overview of materials analysis using atomic excitation, highlighting those features and physical concepts that underpin all these apparently disparate analysis methods. We hope to encourage modern analysts to appreciate the truly complementary nature of the powerful methods at their disposal.

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Updated database for L x‐ray production by protons and extraction of L‐subshell ionization cross sections from only L_γ and L_α + L_β cross sections

Cited by 7 publications

References 40 publications

Ion Beam Analysis: A Century of Exploiting the Electronic and Nuclear Structure of the Atom for Materials Characterisation

Ion Beam Analysis: A Century of Exploiting the Electronic and Nuclear Structure of the Atom for Materials Characterisation

Evaluation of L-shell X-ray production cross sections by impact of [sup 4]He[sup +] ions

Atomic Excitation Exploited By Energetic‐Beam Characterization Methods

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