2006
DOI: 10.1021/la061173q
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Unraveling the Spatial Distribution of Immunoglobulins, Enzymes, and Polyelectrolytes within Layer-by-Layer Self-Assembled Multilayers. Ellipsometric Studies

Abstract: The ellipsometric characterization of a layer-by-layer electrostatically self-assembled multilayer of polyphenol oxidase and alkaline phosphatase with the polycation poly(dimethyldiallylammonium chloride) built on an immunologic layer formed by immunoglobulin G (IgG) and glucose oxidase-conjugated anti-IgG (IgG-GOD) on glassy carbon is reported. The step-by-step evolution of the psi-Delta ellipsometric angles was followed during film growth. Two optical models, named the three-layer film model and reorganizati… Show more

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Cited by 3 publications
(3 citation statements)
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“…Ferreyra, Teijelo, and coworkers prepared bioelectrodes composed of LbL films from an anionic alkaline phosphatase (AP)-polyphenol oxidase (PPO) mixture and the polycation PDDA on top of a glassy carbon electrode modified with an immunological layer. 269 They analyzed structural data obtained from these complex structures, including film thickness, the film optical properties, and the ellipsometric mass values assessed from the two models, threelayer film and reorganization layer. Combination of several analytical methods is sometimes necessary to characterize biological LbL films.…”
Section: Advanced Analyses and Novel Propertiesmentioning
confidence: 99%
“…Ferreyra, Teijelo, and coworkers prepared bioelectrodes composed of LbL films from an anionic alkaline phosphatase (AP)-polyphenol oxidase (PPO) mixture and the polycation PDDA on top of a glassy carbon electrode modified with an immunological layer. 269 They analyzed structural data obtained from these complex structures, including film thickness, the film optical properties, and the ellipsometric mass values assessed from the two models, threelayer film and reorganization layer. Combination of several analytical methods is sometimes necessary to characterize biological LbL films.…”
Section: Advanced Analyses and Novel Propertiesmentioning
confidence: 99%
“…Ellipsometry is a method widely used to study the characteristics of thin films onto modified surfaces [23][24][25]. This technique measures the change in polarization state of light reflected from the surface of a sample in terms of the ellipsometric angles and [26].…”
Section: Fundamentals Of Ellipsometrymentioning
confidence: 99%
“…From the fitting procedure, the complex refractive index, written in terms of its real part, n (refractive index), and imaginary part, k (extinction coefficient), as ň = n -i k [26] were obtained. The optical constants of parallel (extraordinary) and perpendicular (ordinary) direction, referred as n or , k or , n ext and k ext , as well as the thickness for each experimental point, were determined [23].…”
Section: Fundamentals Of Ellipsometrymentioning
confidence: 99%