2002
DOI: 10.1255/ejms.497
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Unimolecular Decomposition in Ion Cyclotron Resonance Traps: Kinetic Energy Release and Microsecond-Scale Kinetics

Abstract: A method of recovering information about the kinetics and dynamics of gas-phase ion-molecule reactions which occur on a microsecond time scale inside a Fourier transform ion cyclotron resonance mass spectrometer (FT-ICR-MS) cell is presented. In FT-ICR experiments, the typical time-scale of the ion detection is of the order of milliseconds to seconds and the microsecond-scale reactions usually run to completion before the detection takes place. However, axial oscillation inside the ICR cell can be made very fa… Show more

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Cited by 3 publications
(3 citation statements)
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“…Kinetic energy distributions of scattered ions have been measured for benzene and Cr(CO) 6 þ as precursor ions (Rakov et al, 2000;Rakov & Futrell, 2002). For Cr(CO) 6 þ and its fragments the most probable kinetic energy of scattered ions is lower than 1 eV and the distributions are fairly narrow (<2 eV FWHM).…”
Section: Kinetic Energy Of Scattered Ionsmentioning
confidence: 99%
See 1 more Smart Citation
“…Kinetic energy distributions of scattered ions have been measured for benzene and Cr(CO) 6 þ as precursor ions (Rakov et al, 2000;Rakov & Futrell, 2002). For Cr(CO) 6 þ and its fragments the most probable kinetic energy of scattered ions is lower than 1 eV and the distributions are fairly narrow (<2 eV FWHM).…”
Section: Kinetic Energy Of Scattered Ionsmentioning
confidence: 99%
“…Kinetic energy distributions of ions derived from benzene are centered at approximately 4 eV (Rakov et al, 2000). However, it has been demonstrated that these distributions have been biased by the potential difference between the surface and the ICR cell (Rakov & Futrell, 2002). Therefore, the most probable energy for benzene fragments has been significantly overestimated.…”
Section: Kinetic Energy Of Scattered Ionsmentioning
confidence: 99%
“…The TOF-SIMS analysis, in comparison, is much faster with only a few microseconds between the sputtering event and detection. Due to the significantly longer residence time of the energized secondary ions prior to analysis in FTICR-SIMS there is a much higher incidence of unimolecular decay and fragmentation as compared to TOF-SIMS. ,, The lower fragmentation yield observed in TOF-SIMS spectra is advantageous for the interpretation of SIMS spectra and for improved detection of secondary ions because signal intensity is distributed over fewer peaks.…”
Section: Resultsmentioning
confidence: 99%