2008
DOI: 10.1016/j.apsusc.2008.05.253
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Uncovering new challenges in bio-analysis with ToF-SIMS

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Cited by 30 publications
(36 citation statements)
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“…In addition, for TOF SIMS heavier elements, like cesium, are preferred for their higher sputter yield. In particular the use of TOF SIMS in the life sciences requires projectiles heavier than Ga [3]. Unfortunately this goes at the expense of spatial resolution, which can only be reached at present with the Ga-based LMIS FIB.…”
mentioning
confidence: 99%
“…In addition, for TOF SIMS heavier elements, like cesium, are preferred for their higher sputter yield. In particular the use of TOF SIMS in the life sciences requires projectiles heavier than Ga [3]. Unfortunately this goes at the expense of spatial resolution, which can only be reached at present with the Ga-based LMIS FIB.…”
mentioning
confidence: 99%
“…The frog egg was very large (approximately 1.2 mm diameter) compared to usual SIMS samples and as such the entire egg was not analyzed. 29,30 However, lipid related species over several hundred Dalton were detected as 10 s of micrometers of material were removed, and, perhaps most importantly, lipid signals not present on the surface of the sample appeared after etching. Figure 3(c) shows a 3D reconstruction of the frog egg data published in Ref.…”
Section: Biological Samplesmentioning
confidence: 99%
“…Reshaping SIMS data based on atomic force microscopy (AFM) data is relatively simple using image processing software assuming the same cell can be imaged with both techniques. 30 Recently, combined SIMS and in vacuum AFM systems have been built that allow correct 3D reconstruction of samples to be performed. 39 This works well for room temperature samples; however, AFM measurements of frozen samples in vacuum is a significant challenge.…”
Section: D Reconstruction Of Tof-sims Datamentioning
confidence: 99%
“…), the analyst is presented with the additional challenges of low ion yields and the lack of molecular specificity of many of the resulting peaks. [1][2][3] Low ion yields are the result of the low ionization efficiencies of ToF-SIMS. Typically less than 1% of the material removed from the surface during the primary ion bombardment is ionized.…”
Section: Introductionmentioning
confidence: 99%
“…1,[3][4][5]8,[18][19][20][21][23][24][25][26] For this work, ToF-SIMS analysts have used a variety of methods to process and understand their data. These include a combination of traditional manual analysis and the application of multivariate analysis (MVA) methods.…”
Section: Introductionmentioning
confidence: 99%