2014
DOI: 10.1063/1.4894251
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Ultraviolet GaN photodetectors on Si via oxide buffer heterostructures with integrated short period oxide-based distributed Bragg reflectors and leakage suppressing metal-oxide-semiconductor contacts

Abstract: Based on a novel double step oxide buffer heterostructure approach for GaN integration on Si, we present an optimized Metal-Semiconductor-Metal (MSM)-based Ultraviolet (UV) GaN photodetector system with integrated short-period (oxide/Si) Distributed Bragg Reflector (DBR) and leakage suppressing Metal-Oxide-Semiconductor (MOS) electrode contacts. In terms of structural properties, it is demonstrated by in-situ reflection high energy electron diffraction and transmission electron microscopy-energy dispersive x-r… Show more

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Cited by 5 publications
(4 citation statements)
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References 40 publications
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“…Therefore, it may be a good solution to replace the native oxides by controllable growth of high quality Ga 2 O 3 . Ga 2 O 3 is a oxide semiconductor or dielectric material with large band gap (4.9 eV) [3] , good thermal and chemical stabilities, and high dielectric constant (10.6) [4,5] . Ga 2 O 3 thin film has been applied in a wide variety of applications, including optoelectronic devices [6] , gas sensor devices [4] , passivation or dielectric layers for III-V based microelectronics [7,8] .…”
Section: Introductionmentioning
confidence: 99%
“…Therefore, it may be a good solution to replace the native oxides by controllable growth of high quality Ga 2 O 3 . Ga 2 O 3 is a oxide semiconductor or dielectric material with large band gap (4.9 eV) [3] , good thermal and chemical stabilities, and high dielectric constant (10.6) [4,5] . Ga 2 O 3 thin film has been applied in a wide variety of applications, including optoelectronic devices [6] , gas sensor devices [4] , passivation or dielectric layers for III-V based microelectronics [7,8] .…”
Section: Introductionmentioning
confidence: 99%
“…Among lots of wide-bandgap semiconductors, gallium nitride (GaN) has the same wurtzite structure with ZnO and similar wide direct bandgap (3.4 eV). , But few reports were available for the CZTS/GaN heterojunction. Due to the advantages of high saturation velocity (2.7 × 10 7 cm/s), radiation hardness, tolerability of aggressive environments, and a more mature processing technique, GaN was widely used for fabricating photodetectors. More importantly, the type-I band alignment of the CZTS/GaN interface with a small conduction band offset benefits to carrier separation and transport at the interface, so a p-CZTS/n-GaN heterojunction photodetector is expected to be a promising device with high performance.…”
Section: Introductionmentioning
confidence: 99%
“…DBRs have great potential, allowing a wide range of applications such as wavelength filters, , antireflective surfaces, , detectors, and lasers. Furthermore, they can be designed to reflect UV radiation in sunglasses, to regulate IR component in smart windows and reduce overheating of indoor environments, to investigate strong light–matter interactions in organic and inorganic microcavities, to study topological quantum fluids, or to obtain high reflectivity for long-distance propagation of the optical excitation in organic materials . They can also be used in sensing application, in photovoltaic cells to maximize absorbed light, in OLEDs to maximize light outcoupling, or to develop devices capable of emitting strong monochromatic light. …”
Section: Introductionmentioning
confidence: 99%