La 0.6 Ca 0.4 CoO 3 (LCCO) thin films were deposited on MgO(001) and stainless steel substrates by pulsed reactive crossed-beam laser ablation (PRCLA). The film stoichiometry was characterized by Rutherford backscattering spectrometry (RBS). The data confirmed that the material transfer from the target to the substrate is congruent. The thickness and surface roughness of the films is in the range of 200-500 and 2-12 nm, respectively, depending on the deposition conditions. The quality of the deposited film was analyzed by X-ray diffraction (XRD) and high resolution transmission electron microscopy (HRTEM). Epitaxial and single oriented thin films could be grown. In view of the importance of the surface composition in electrochemistry, X-ray photoelectron spectroscopy (XPS) measurements were performed. The electrochemical activity of the LCCO films is influenced by the crystallinity of the film.