2016
DOI: 10.1016/j.tsf.2016.03.062
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Ultrathin junctions based on the LaSrMnO3/Nb:SrTiO3 functional oxide interface

Abstract: High-quality all-oxide thin film metal-semiconductor junctions, fabricated of a half-metallic ferromagnet La 0.7 Sr 0.3 MnO 3 and of a niobium doped n-type semiconductor SrTiO 3 (SrTi 0.8 Nb 0.2 O 3) by pulsed laser deposition, were studied in terms of their electronic transport properties in a wide temperature range. A fabrication process for ultrathin film metal-semiconductor junctions with micrometre-sized mesas has been established. The current-voltage characteristics of the junctions were found at varianc… Show more

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Cited by 6 publications
(5 citation statements)
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“…There are several invaluable features of the Nb:STO insulator that acts as a tunnelling barrier for electrons. 7 First, the magneto-resistance versus magnetic field curve ( Fig. 1(c)) demonstrates the typical TMR behaviour observed in junctions with an undoped STO insulator.…”
mentioning
confidence: 72%
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“…There are several invaluable features of the Nb:STO insulator that acts as a tunnelling barrier for electrons. 7 First, the magneto-resistance versus magnetic field curve ( Fig. 1(c)) demonstrates the typical TMR behaviour observed in junctions with an undoped STO insulator.…”
mentioning
confidence: 72%
“…5 In contact with LSMO, Nb:STO forms a metalsemiconductor interface, providing a structure similar to a Schottky junction. 6,7 Thus, a different type of STO-based tunnel junction arises: MTJ with a double Schottky barrier instead of the conventional insulating tunnel barrier. The use of a semiconducting barrier can be traced back to the pioneering work of M. Jullière.…”
mentioning
confidence: 99%
“…The Coulomb repulsion energy ( U = 4 eV) and the exchange interaction ( J = 1 eV) came from ref. [33]. An energy cutoff of 400 eV and a 4 × 4 × 4 Monkhorst–Pack k‐point grid were adopted.…”
Section: Methodsmentioning
confidence: 99%
“…The Schottky barrier height (SBH) φ b can be extracted by fitting the data with the well‐known expression of the thermionic emission current density. [ 33–35 ]…”
Section: Figurementioning
confidence: 99%
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