1989
DOI: 10.1063/1.101713
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Ultralong minority-carrier lifetime epitaxial GaAs by photon recycling

Abstract: The minority-carrier lifetime has been measured by time-resolved photoluminescence in epitaxial films of GaAs grown by metalorganic chemical vapor deposition. The measured lifetimes in thicker devices are 4 to 6 times the theoretical or radiative lifetime. These long lifetimes are the result of photon recycling or self-generation of the self-absorbed radiation.

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Cited by 87 publications
(37 citation statements)
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“…Using the reflectivity of the metal mirror, the thin-film cell can be designed to take advantage of the so-called photon recycling effect. This effect was already described in 1977 by Asbeck [49] and was experimentally confirmed by the very high photoluminescence lifetimes measured in GaAs layers cladded by AlGaAs [50]. Photons emitted through radiative recombination in the active layers are confined within the cell and likely to be re-absorbed.…”
Section: New Device Designssupporting
confidence: 51%
See 1 more Smart Citation
“…Using the reflectivity of the metal mirror, the thin-film cell can be designed to take advantage of the so-called photon recycling effect. This effect was already described in 1977 by Asbeck [49] and was experimentally confirmed by the very high photoluminescence lifetimes measured in GaAs layers cladded by AlGaAs [50]. Photons emitted through radiative recombination in the active layers are confined within the cell and likely to be re-absorbed.…”
Section: New Device Designssupporting
confidence: 51%
“…the controlled spalling technology [61,62], are still in its infancy. In the last five years, companies like Alta Devices [63] and Microlink Devices [26,50,52,54] have developed a wafer-scale, epitaxial lift-off manufacturing process and are currently in pilot production. Activities in Europe are also initiated (tf2 devices).…”
Section: Future Perspectivesmentioning
confidence: 99%
“…Since GaAs can be fabricated with very high purity and excellent surface passivation via III-V capping layers, we consider only Auger recombination as it is the sole intrinsic, unavoidable source of nonradiative recombination. 15,[21][22][23][24] With increased voltage from photon recycling, Auger recombination increases relative to radiative emission. Thus, as Figure 2b illustrates, the effect of Auger recombination is the greatest for narrow emission angles, and there is little benefit for emission angles below 1 6 .…”
Section: (2)mentioning
confidence: 99%
“…The photon recycling factor affects the lifetime since the observed radiative lifetime is only a measure of the photons escaping the structure and photons emitted inside the absorber can easily be reabsorbed. 12,13 Re-absorption of photons in the structure extends the radiative lifetime by a factor / compared to the nominal radiative lifetime, which is s R ¼ 1/Bn 0 . With the modulated laser excitation power used in the OMR measurement technique, the excess carrier density, n e , is governed by the stationary and the modulated generation rates G 0 ($P 0 /(AdE ph )) and G 1 ($P 1 /(AdE ph )), respectively, as given by…”
mentioning
confidence: 99%