2010
DOI: 10.1109/lmag.2010.2050679
|View full text |Cite
|
Sign up to set email alerts
|

Ultrahigh Coercivity Magnetic Force Microscopy Probes to Analyze High-Moment Magnetic Structures and Devices

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
3
0

Year Published

2011
2011
2021
2021

Publication Types

Select...
5

Relationship

0
5

Authors

Journals

citations
Cited by 6 publications
(3 citation statements)
references
References 19 publications
0
3
0
Order By: Relevance
“…Moreover, because of the diamond tip's well-defined material composition and extremely sharp end radius (<10 nm), quantitative and high-resolution field maps of the pole can be reconstructed. Our method thus provides advantages over magnetic force microscopy (MFM) 13 14 15 16 17 and electron holography 18 , which are difficult to quantify, barely reach sufficient resolution, or provide two-dimensional projections.…”
mentioning
confidence: 99%
“…Moreover, because of the diamond tip's well-defined material composition and extremely sharp end radius (<10 nm), quantitative and high-resolution field maps of the pole can be reconstructed. Our method thus provides advantages over magnetic force microscopy (MFM) 13 14 15 16 17 and electron holography 18 , which are difficult to quantify, barely reach sufficient resolution, or provide two-dimensional projections.…”
mentioning
confidence: 99%
“…The ideal hard magnetic single-domain tip should be an elongated needle, which has the highest shape anisotropy [2] made out of rare-earth alloy with hard magnetic phase. State-of-the-art technologies for nanomagnet fabrication are FIB [3][4][5][6][7], STM, electrodeposition and chemical vapor deposition (CVD), among others [8][9][10][11][12][13][14][15][16]. However, most of fabricated nanomagnets are made of soft, low aspect ratio thin-film materials.…”
Section: Introductionmentioning
confidence: 99%
“…In 2010, Amos et al slightly enhanced the coercivity of FePt films deposited on Si probes, to between 1.1 and 1.2 T, by using CrRu and MgO seed layers (CrRu/MgO/FePt) and by optimizing the deposition conditions (temperature and pressure). [10] They also demonstrated the interest for these probes by imaging perpendicular magnetic recording write head under various excitation conditions. In 2018, Neu et al used the focus ion beam method to cut triangle-shaped tips out of epitaxial SmCo5 films with a coercivity of 2.5 T, and then attached them to force cantilevers with the aid of a nanomanipulation tool, for MFM imaging.…”
mentioning
confidence: 98%