2008
DOI: 10.1143/jpsj.77.014711
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Ultrafast Time Dependence of Surface Photo-Voltage Effect onp-Type GaAs(100) Surface

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Cited by 22 publications
(20 citation statements)
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“…Therefore, the recombination is dominated by the photo-excited electron dynamics in the n-type GaAs. In our previous reports [4,5], it was supposed that the fast decay component is due to the hot electron relaxation in the conduction band because Shank et al reported that the hot carrier distribution approaches to the lattice temperature with a similar time constant of approximately 4 ps [10]. The present experiment shows that the lifetime of the fast decay component was hardly affected by the dopant level, laser power, and sample temperature which change the barrier height of the surface potential and the depth of the band bending region, in other words, the space charge region (SCR).…”
Section: Discussionmentioning
confidence: 88%
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“…Therefore, the recombination is dominated by the photo-excited electron dynamics in the n-type GaAs. In our previous reports [4,5], it was supposed that the fast decay component is due to the hot electron relaxation in the conduction band because Shank et al reported that the hot carrier distribution approaches to the lattice temperature with a similar time constant of approximately 4 ps [10]. The present experiment shows that the lifetime of the fast decay component was hardly affected by the dopant level, laser power, and sample temperature which change the barrier height of the surface potential and the depth of the band bending region, in other words, the space charge region (SCR).…”
Section: Discussionmentioning
confidence: 88%
“…In our previous papers [4,5], the ultrafast photoexcited carrier dynamics on the n-type and p-type GaAs(100) surfaces were reported by measuring the temporal behaviour of the surface photo-voltage (SPV) effect, which is originated from the charge separation of the photo-excited carriers driven by the surface band bending [6,7]. In those reports, the fast SPV decay, which indicates the fast carrier recombination in the surface region, was found only on the n-type GaAs(100) surface.…”
mentioning
confidence: 97%
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“…[3][4][5][6] However, except for Si ͑Refs. 7 and 8͒ and GaAs, 9,10 no transient SPV measurements using XPS have been reported to date. The high photon density of commercial monochromatic x-ray sources allows for reasonably fast ͑subsecond͒ acquisition of XPS data of a narrow spectral region to be recorded in the snap-shot mode, which can reveal the transient behavior of a sample, in a chemically addressed fashion, when subjected to external stresses like light illumination, resulting in SPV.…”
mentioning
confidence: 99%
“…Currently sub-ps photons are available from (i) laser, [57][58][59][60][61][62][63][64][65][66] (ii) laser-driven HHG, [67][68][69][70][71] and (iii) free electron laser. [20][21][22][23][24] Irradiating light onto a sample, electrons are pumped to unoccupied (transient) states at time < fs, followed by relaxation to the original ones.…”
Section: Time-resolved Pes In Ps To Fs Time-scalementioning
confidence: 99%