2010
DOI: 10.1364/oe.18.023562
|View full text |Cite
|
Sign up to set email alerts
|

Ultra-low loss Si_3N_4 waveguides with low nonlinearity and high power handling capability

Abstract: We investigate the nonlinearity of ultra-low loss Si3N4-core and SiO2-cladding rectangular waveguides. The nonlinearity is modeled using Maxwell's wave equation with a small amount of refractive index perturbation. Effective n2 is used to describe the third-order nonlinearity, which is linearly proportional to the optical intensity. The effective n2 measured using continuous-wave self-phase modulation shows agreement with the theoretical calculation. The waveguide with 2.8-μm wide and 80-nm thick Si3N4 core ha… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1

Citation Types

3
46
0

Year Published

2011
2011
2022
2022

Publication Types

Select...
9

Relationship

4
5

Authors

Journals

citations
Cited by 66 publications
(49 citation statements)
references
References 11 publications
3
46
0
Order By: Relevance
“…The results are in agreement with [10], where nonlinearities of different core thicknesses were investigated. To determine the optimal waveguide length for the following nonlinear experiments, we simulated the FWM-based idler generation by solving the nonlinear Schrödinger equation (NLSE) with the split-step Fourier method.…”
supporting
confidence: 89%
See 1 more Smart Citation
“…The results are in agreement with [10], where nonlinearities of different core thicknesses were investigated. To determine the optimal waveguide length for the following nonlinear experiments, we simulated the FWM-based idler generation by solving the nonlinear Schrödinger equation (NLSE) with the split-step Fourier method.…”
supporting
confidence: 89%
“…This product of nonlinear coefficient γ, power level P, and effective length L eff must be maximized to achieve high FWM efficiency. As the nonlinear Kerr coefficient of Si 3 N 4 is one order of magnitude greater than the one in SiO 2 [10], a higher γ and a more efficient Kerr process is achieved in Si 3 N 4 . Although Si has even higher nonlinearities, the nonlinear losses originating from two-photon absorption (TPA) and free carrier absorption at telecom wavelengths limit the maximum power levels P that can be sent in this material.…”
mentioning
confidence: 99%
“…However, the use of this platform as a nonlinear tool is still hindered by fabrication difficulties that prevent the possibility of growing thick SiN layers on SiO 2 (>200 nm) [24], thus drastically reducing the ability of confine light tightly within the core material, and in turn limiting the overall nonlinear response of the device. Moreover, the silicon nitride Kerr coefficient is substantially lower than that in silicon [64] (two orders of magnitude lower), further reducing the strength of the nonlinear effects. Recently, a number of research groups have proposed the use of silicon-enriched silicon nitride compounds, aiming to increase the device nonlinear response [59,[65][66][67][68].…”
Section: Engineered Silicon Rich Silicon Nitridementioning
confidence: 98%
“…This ultralow loss waveguide (ULLW) platform enables long delay lines, low-loss AWGs [81], high-Q ring resonators [82], and highextinction ratio waveguide polarizers [83]. Moreover, the low nonlinearity of SiO 2 and the relatively large mode sizes allow for high power handling [84].…”
Section: F Ultralow Loss Waveguides and Componentsmentioning
confidence: 99%