Advanced Photonics 2016 (IPR, NOMA, Sensors, Networks, SPPCom, SOF) 2016
DOI: 10.1364/iprsn.2016.iw1a.3
|View full text |Cite
|
Sign up to set email alerts
|

Ultra-Compact CMOS-Compatible Ytterbium Microlaser

Abstract: We demonstrate a waveguide-coupled trench-based ytterbium microlaser, achieving a sub-milliwatt lasing threshold and a 1.9% slope efficiency within an ultra-compact 40-µm-radius cavity while maintaining full compatibility with a CMOS foundry process.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4

Citation Types

0
8
0

Year Published

2017
2017
2020
2020

Publication Types

Select...
6
1

Relationship

4
3

Authors

Journals

citations
Cited by 10 publications
(8 citation statements)
references
References 13 publications
(16 reference statements)
0
8
0
Order By: Relevance
“…In [13], we demonstrated a new type of micro-trench cavity, which has the advantages that it uses all silicon-photonicscompatible processing steps, is embedded in a silica cladding for robust form factor, has a nano-scale defined microcavity-waveguide gap for finely controlled and stable coupling, and can in principle accept any sputtered material as the resonator medium. Using this design we have demonstrated low threshold Yb-, Er-and Tm-doped aluminum oxide microlasers emitting at 1.0, 1.5 and 1.9 µm, respectively [13][14][15] and an athermal microcavity design using sputtered titanium dioxide as the resonator medium [16]. In [13] we reported Q factors of up to 5.7 × 10 5 at 1550 nm in undoped cavities, but we did not describe their design in detail or optimize their performance.…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…In [13], we demonstrated a new type of micro-trench cavity, which has the advantages that it uses all silicon-photonicscompatible processing steps, is embedded in a silica cladding for robust form factor, has a nano-scale defined microcavity-waveguide gap for finely controlled and stable coupling, and can in principle accept any sputtered material as the resonator medium. Using this design we have demonstrated low threshold Yb-, Er-and Tm-doped aluminum oxide microlasers emitting at 1.0, 1.5 and 1.9 µm, respectively [13][14][15] and an athermal microcavity design using sputtered titanium dioxide as the resonator medium [16]. In [13] we reported Q factors of up to 5.7 × 10 5 at 1550 nm in undoped cavities, but we did not describe their design in detail or optimize their performance.…”
Section: Introductionmentioning
confidence: 99%
“…Figure 1 shows the aluminum oxide micro-trench cavity fabrication process. The processing steps are similar to those described in [13][14][15], but repeated here for clarity and to avoid confusion with small design differences. We fabricated the microcavity chips using a 300-mm CMOS foundry with a 65-nm technology node.…”
Section: Introductionmentioning
confidence: 99%
“…In particular, integrated lasers beyond 2.0 μm are in demand due to the diminishing two-photon absorption of silicon [15,16] while also providing a new communication band for integrated systems [1]. Among the different methods to integrate lasers on a silicon photonics platform [17][18][19][20][21][22], deposition of rare-earthdoped Al 2 O 3 glass as gain medium [11,[22][23][24] and utilizing complementary metal-oxidesemiconductor (CMOS)-compatible silicon nitride (Si 3 N 4 ) cavities has proven to be effective for several key reasons. First, Si 3 N 4 has high transparency and low loss from near-IR into the mid-IR wavelength regime and is a mature wafer-scale waveguide platform already applied in passive and nonlinear silicon photonic devices [25][26][27].…”
Section: Introductionmentioning
confidence: 99%
“…Finally, the low thermo-optic coefficient of the host medium (Al 2 O 3 ) enables laser operation over a wide temperature range by providing good stability without active thermal control [41,42]. Rareearth-ion-based monolithic lasers integrated on a silicon platform have been demonstrated at 1.0, 1.5 and 1.9 µm wavelengths using ytterbium [24,43], erbium [14,22,23] and thulium [11,44] doped Al 2 O 3 glass as gain medium, respectively. However, to the best of our knowledge, monolithic integrated lasers beyond the 2 μm region have been minimally explored with no known demonstration of a holmium laser on a silicon photonics platform.…”
Section: Introductionmentioning
confidence: 99%
“…Using CMOS-compatible fabrication methods, rare-earth-ion-based monolithically integrated lasers have been demonstrated across near-infrared wavelengths at 1.0, 1.5, 1.8, 2.1 µm using ytterbium 52,53 , erbium 25,27,54 , thulium 37,55 , and holmium 56 doped Al 2 O 3 glass as gain media, respectively. These lasers use silicon-nitride (Si 3 N 4 ) cavities, as Si 3 N 4 has high transparency and low loss from near-IR to the mid-IR wavelength regime 57,58 .…”
mentioning
confidence: 99%