Vacuum-condensed Ni 81-Fe 1% films (thickness about 500 x, crystallite size approximately 150 x) a r e investigated by various methods of Lorentz microscopy ( 1 , 2). Among these low-angle electron diffraction (Fraunhofer diffraction) yields direct information about the magnetization directions (3) and, therefore, about the magnetic structure within the domain walls. The electron microscope is used as a high resolution diffraction camera similar to the way described by Wade and Silcox (4). Operating the Siemens Elmiskop I at 80 kV, an effective camera length of 40 m i s obtained. The objective lens is switched off, thus the domain configuration of the specimen is not affected by an external magnetic field. A distinct specimen area is chosen by a small object aperture. By variation of the intermediate lens current, off-focus images as well a s Lorentz deflection patterns can be produced of the same specimen area. In Fig. 3 such off-focus images and their corresponding Lorentz deflection patterns of a simple domain wall and of a cross-tie wall are shown. Images and deflection patterns are in correct orientation. A rotation by ~/ 2because of the Lorentz force must be accounted for if the deflection pattern i s to be read as a magnetization direction diagram. It can be shown that the observed streaks a r e not a wave-optical diffraction phenomenon (5, 6 ) . The interpretation of the different streaks indicated in Fig. 1 is given in Fig. 2. Theoretically, wall models have been discussed which a r e neither of pure Rloch nor of pure Nee1 type, so for instance the intermediate wall (7, 8) or the mixed wall (9). In the case of a one-dimensional 180 domain wall, these models do not yield a stable configuration with respect to wall energy (8, 9). Nevertheless, a Bloch component within cross-tie walls has been proposed to explain the observed Bloch line shift under the influence of a magnetic field in the direction perpendicular to the plane of the film (10). According to the interpretation given in Fig. 2 a new 0