2009
DOI: 10.1143/jjap.48.04c187
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Two-Dimensional Si-Nanodisk Array Fabricated Using Bio-Nano-Process and Neutral Beam Etching for Realistic Quantum Effect Devices

Abstract: The formation and evolution of defects induced by 100 MeV Si 7+ ion irradiation in the Au/n-Si (1 0 0) Schottky barrier structure were studied and correlated with the electrical characteristics of the structure. The Schottky barrier decreases to 0.67 ± 0.01 eV after irradiation at a fluence of 1 × 10 11 ions cm −2 and remains immune to further irradiation up to a fluence of 1 × 10 12 ions cm −2 . A combination of in situ deep level transient spectroscopy and current-voltage measurements of Au/n-Si diodes demon… Show more

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Cited by 33 publications
(35 citation statements)
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“…[9][10][11] With this process we were able to obtain a 2D array of ferritin iron oxide cores (diameter: 7 nm; density: $8 Â 10 11 cm À2 ) and…”
mentioning
confidence: 99%
“…[9][10][11] With this process we were able to obtain a 2D array of ferritin iron oxide cores (diameter: 7 nm; density: $8 Â 10 11 cm À2 ) and…”
mentioning
confidence: 99%
“…To solve this problem, we have employed Si nanodisks (NDs) fabricated by damage-free neutral-beam etching using bio-nano-templates [6-8]. A closely packed two-dimensional alignment of the Si ND with a diameter of 10 nm and interspacing of 2 nm was formed, where the sheet density was 5 × 10 11 cm −2 .…”
Section: Introductionmentioning
confidence: 99%
“…12,13 This fabrication process allows us to design the precise size and spacing of the closely packed Si-NDs with flexible film stacking. Each wavefunction can spread over neighboring NDs in this periodic regular alignment of the ND with ultrathin potential barriers.…”
mentioning
confidence: 99%
“…Details of the fabrication process are described elsewhere. 13,14 The ND diameter, thickness, and the interspacing were intentionally designed at 10, 8, and 2 nm, respectively, by this ferritin protein engineering. We prepared an isolated low-density ND sample whose average inter-disk distance was more than 40 nm, as a reference.…”
mentioning
confidence: 99%