Two-dimensional position-sensitive detectors for high resolution diffraction with neutrons and high energy synchrotron radiation

Marmotti, M.; Burmester, J.; Haese, Martin; Kampmann, R.

doi:10.1016/s0168-9002(01)01864-2

Cited by 6 publications

(2 citation statements)

References 4 publications

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“…A ³He 2D counter with a sensitive area of 20*20 cm² [6] will replace the single counter in order to improve the background correction and speed of crystal orientation determination. …”

Section: Current Projectsmentioning

confidence: 99%

Scientific Review: HEiDi: Single Crystal Diffractometer at the Hot Source of the FRM II

2007

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“…A ³He 2D counter with a sensitive area of 20*20 cm² [6] will replace the single counter in order to improve the background correction and speed of crystal orientation determination. …”

Section: Current Projectsmentioning

confidence: 99%

Scientific Review: HEiDi: Single Crystal Diffractometer at the Hot Source of the FRM II

2007

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“…In particular two detectors can be used in order to still acquire two dimensions of the strain field. However, in a greater distance the requests regarding spatial resolution of the detectors is relaxed and position sensitive gas detectors as developed by DENEX 2 can be employed (Kampmann et al, 2001;Marmotti et al, 2002). Those detectors are not isotropic and the position resolving wires are oriented radially to the Debye-Scherrer ring in order to receive a resolution of about 1 mm.…”

Section: Texture and Stress Analysismentioning

confidence: 99%

High‐Energy X‐Rays: A tool for Advanced Bulk Investigations in Materials Science and Physics

Liss

Bartels

Schreyer³

et al. 2003

Texture, Stress, and Microstructure

187

132

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High-energy X-rays between 30 keV and 1 MeV, such as provided by modern synchrotron radiation sources as the ESRF and HASYLAB, bear the advantage of high penetration into most materials. Even heavy element compositions can be accessed in their volume. The range of applications is huge and spreads from nuclear spectroscopy to the characterization of metal extrusion under industrial conditions. This article compiles an overview over the most common instrumental diffraction techniques.Modern two-dimensional detectors are used to obtain rapid overviews in reciprocal space. For example, diffuse scattering investigations benefit from the very flat Ewald sphere as compared to low energies, which allow mapping of several Brillouin zones within one single shot. Diffraction profiles from liquids or amorphous materials can be recorded easily. For materials science purposes, whole sets of Debye-Scherrer rings are registered onto the detector, their diameters and eccentricities or their intensity distribution along the rings relating to anisotropic strain or texture measurements, respectively. At this point we stress the resolution of this technique which has to be carefully taken into account when working on a second generation synchrotron source.Energy-dispersive studies of local residual strain can be studied by a dedicated three-circle diffractometer which allows accurately to adjust the scattering angle from a defined gauge volume.Triple axis diffractometry and reciprocal space mapping is introduced and can be employed for highest resolution purposes on single crystal characterization, even under heavy and dense sample environments. Thus, the perfection of single crystals can be mapped and strain fields and superstructures as introduced by the modulation from ultrasonic waves into crystals or epitaxially grown Si/Ge layers can be investigated in detail. Phase transitions as magnetic ordering can be studied directly or through its coupling to the crystal lattice. Time resolved studies are performed stroboscopically from a sub-nanosecond to a second time scale.The combination of these techniques is a strong issue for the construction and development of future instruments.

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2D-MWPC for the new reflectometer REFSANS/FRM-II: performance of the prototype

Kampmann

Marmotti²,

Haese

et al. 2004

Nuclear Instruments and Methods in Physics Research Section A:

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Two-dimensional position-sensitive detectors for high resolution diffraction with neutrons and high energy synchrotron radiation

Cited by 6 publications

References 4 publications

Scientific Review: HEiDi: Single Crystal Diffractometer at the Hot Source of the FRM II

Scientific Review: HEiDi: Single Crystal Diffractometer at the Hot Source of the FRM II

High‐Energy X‐Rays: A tool for Advanced Bulk Investigations in Materials Science and Physics

2D-MWPC for the new reflectometer REFSANS/FRM-II: performance of the prototype

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