1996
DOI: 10.1063/1.362951
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Two-dimensional device modeling and analysis of GaInAs metal–semiconductor–metal photodiode structures

Abstract: A two-dimensional self-consistent time-dependent simulation technique has been developed to investigate electron-hole transport processes in the active region of metal–semiconductor–metal (MSM) interdigitated photodiode structures and to analyze their high-speed response. The distribution of the electric field inside the MSM device is determined by numerically solving the two-dimensional Poisson’s equation by the modified fast elliptic solver method. A set of superparticles photogenerated at a particular wavel… Show more

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Cited by 53 publications
(18 citation statements)
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“…As shown in Ref. 8, the hole-current contribution is about 1/5 of the total current. Hence, the hole current does not appreciably influence the FWHM.…”
Section: Measurements Of Ingaas Metal-semiconductor-metal Photodetectmentioning
confidence: 93%
See 1 more Smart Citation
“…As shown in Ref. 8, the hole-current contribution is about 1/5 of the total current. Hence, the hole current does not appreciably influence the FWHM.…”
Section: Measurements Of Ingaas Metal-semiconductor-metal Photodetectmentioning
confidence: 93%
“…Recently, a two-dimensional device model was used to investigate the temporal impulse response of GaAs MSM-PDs under highillumination conditions ͑ϳ200 pJ͒ 6,7 and the response of InGaAs MSM-PDs as a function of bias voltage for low optical pulse energy ͑Ͻ0.1 pJ͒. 8 In Refs. 6 and 7, simulations show that the impulse response of GaAs MSM-PDs is distorted, and the bandwidth and efficiency of the devices are reduced due to screening of the dark electric field at high optical excitation levels.…”
Section: Measurements Of Ingaas Metal-semiconductor-metal Photodetectmentioning
confidence: 99%
“…10 and 11. This departure from the simple scaling is caused by space-charge effects due to non-linearities in the velocity-field behavior of the electrons and holes (Averine et al 1996).…”
Section: Analysis Of Detector Speed Of Responsementioning
confidence: 99%
“…One then can expect modification of the internal electric field that governs the carrier drift processes in these structures. For that reason we have also used a two-dimensional time-dependent simulation technique (Averine et al 1996) to investigate electron-hole transport processes in the active region of GaN-based MSM-PD and analyze detector high-speed response at different energy levels of optical illumination. We also used this model to compare dynamic range potentialities of GaN-based MSM detector with that of on GaAs.…”
Section: Analysis Of Detector Speed Of Responsementioning
confidence: 99%
“…В качестве базовой структуры для исследова-ний были выбраны поверхностно-барьерные планар-ные диоды на основе выпрямляющего контакта в системе металл−полупроводник−металл (МПМ ди-од) [8][9][10]. МПМ детекторы изготовлены на сверхре-шетке ZnSe/ZnTe, структура и толщины слоев которой приведены на pис.…”
Section: методика экспериментаunclassified