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2001
DOI: 10.1016/s0079-6727(01)00003-9
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Tunnelling generation–recombination currents in a-Si junctions

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Cited by 19 publications
(16 citation statements)
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“…7). The trapassisted tunneling carrier capture and emission has already been proposed to model the transport mechanism in a-Si p-n homojunctions, 27 and different approaches exist to model this mechanism. 28,29 Moreover, this mechanism allows also to explain the current transport in amorphous silicon n/p tunnel junctions present in tandem solar cells.…”
Section: à2mentioning
confidence: 99%
“…7). The trapassisted tunneling carrier capture and emission has already been proposed to model the transport mechanism in a-Si p-n homojunctions, 27 and different approaches exist to model this mechanism. 28,29 Moreover, this mechanism allows also to explain the current transport in amorphous silicon n/p tunnel junctions present in tandem solar cells.…”
Section: à2mentioning
confidence: 99%
“…Meanwhile, the predominated transport in a-Si:H solar cells is governed by drift collection [36,37]. The internal electric field plays a vital role to enhance the drift current while restrain the diffusion current flow from p to n layer [38,39]. The regions with different electric fields can be considered as sub-cells that compose the whole solar cell in parallel or series configurations.…”
Section: Theory and Calculationmentioning
confidence: 99%
“…This process occurs when an electron tunnels to a trap in the band gap and is then thermally excited out of the trap. This can result in a temperature dependent subthreshold swing voltage as well as temperature dependent threshold shifts [24,[44][45][46]. It also increases the subthreshold swing voltage by preventing the tunneling from turning off.…”
Section: Other Design Issues To Avoidmentioning
confidence: 99%