2003
DOI: 10.1134/1.1633958
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Tunneling radiative recombination in p-n heterostructures based on gallium nitride and other AIIIBV semiconductor compounds

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Cited by 10 publications
(13 citation statements)
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“…52 Furthermore, low energy emission band (1.9-2.7 eV) observed in nitride tunneling diodes was attributed to tunneling and found to be related to the high electric field strength. 49 Thus, under reverse bias, tunneling of the electrons occurs from pGaN to ZnO resulting in the appearance of holes in the pGaN. At the same time, the electron injection into p-GaN is expected to be more efficient than the injection of holes into ZnO, and consequently recombination would occur on the pGaN side of the junction.…”
Section: The Origin Of the Emission Peaksmentioning
confidence: 99%
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“…52 Furthermore, low energy emission band (1.9-2.7 eV) observed in nitride tunneling diodes was attributed to tunneling and found to be related to the high electric field strength. 49 Thus, under reverse bias, tunneling of the electrons occurs from pGaN to ZnO resulting in the appearance of holes in the pGaN. At the same time, the electron injection into p-GaN is expected to be more efficient than the injection of holes into ZnO, and consequently recombination would occur on the pGaN side of the junction.…”
Section: The Origin Of the Emission Peaksmentioning
confidence: 99%
“…Tunneling phenomena in III-nitride heterojunctions have been previously observed for different material combinations. [48][49][50][51] Furthermore, since the lattice mismatch between GaN and ZnO is higher than 1%, interface states are expected to significantly affect the current flow across the junction and severely limit the injection of the minority carriers. 52 Thus, significant current transport mechanisms in these devices are expected to involve tunneling and recombination at the interface, 52 and the tunneling likely involves the defect states at the interface, as illustrated in Fig.…”
Section: B Performance Under Reverse Biasmentioning
confidence: 99%
“…According to our study we concluded that this 600 nm emission at low currents was caused by tunneling radiative recombination process and appeared only in some local LED areas at low forward bias. Kudryashov et al have used [3,4] the model of diagonal tunneling [6][7][8] for description of similar long wavelength peaks in emission spectra for GaN based green and blue LEDs at low currents. We assume that local red emission in our green LEDs can be attributed to the similar diagonal tunneling process.…”
Section: Methodsmentioning
confidence: 99%
“…Degradation in I-V characteristics was attributed to the tunneling process [1,2]. The spectra of tunneling emission in blue and green LEDs under low current regime were intensively investigated [2][3][4]. In our work, we used the confocal microscopy to study the distribution and spectral properties of local tunneling recombination emission (~600 nm) in green LEDs under low current regime.…”
mentioning
confidence: 98%
“…3,4 As a result, the population of different QWs in the active region is strongly inhomogeneous with p-side QW dominating the optical emission. 7,8 In LD structures, the under-pumped QWs add their interband absorption to the a͒ Author to whom correspondence should be addressed. Carrier accumulation pockets around EBL can also lead to excessive carrier leakage due to the tunnel-recombination process.…”
Section: Introductionmentioning
confidence: 99%