Abstract:We have measured the tunneling characteristics (I, dV/dI, and dZV/dI 2 vs. voltage) for a series or junctions of the form Al-Ox-Cu-Pb for Cu thicknesses ranging from 400 to 3000 ~. From the second derivative characteristics we obser~c two distinct contributions, one from an electron interference effect and another from the interaction of the superconducting electrons with phonons in the Cu. These contributions may be separated by the application of a magnetic field less than the critical field of the sandwich.… Show more
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