2021
DOI: 10.1007/978-981-16-5048-2_17
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Tunnel FET Based SRAM Cells – A Comparative Review

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Cited by 8 publications
(1 citation statement)
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“…In particular, the uncontrollable forward p-i-n current grows rapidly with the V SD increasing, which will limit its application in circuits [13]. Many studies have been conducted on the TFET applications in SRAM design [13][14][15][16][17][18][19][20][21][22][23], but a series of problems are still not resolved, especially the following two problems: 1. The problem of large static power consumption caused by forward p-i-n current in the transmission transistor.…”
Section: Introductionmentioning
confidence: 99%
“…In particular, the uncontrollable forward p-i-n current grows rapidly with the V SD increasing, which will limit its application in circuits [13]. Many studies have been conducted on the TFET applications in SRAM design [13][14][15][16][17][18][19][20][21][22][23], but a series of problems are still not resolved, especially the following two problems: 1. The problem of large static power consumption caused by forward p-i-n current in the transmission transistor.…”
Section: Introductionmentioning
confidence: 99%