2013
DOI: 10.1021/am401003k
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Tuning Electrical Properties in Amorphous Zinc Tin Oxide Thin Films for Solution Processed Electronics

Abstract: Solution processed zinc tin oxide (ZTO) thin film transistors (TFTs) were fabricated by varying the Zn/Sn composition. The addition of Sn to the zinc oxide (ZnO) films resulted in improved electrical characteristics, with devices of Zn0.7Sn0.3O composition showing the highest mobility of 7.7 cm(2)/(V s). An improvement in subthreshold swings was also observed, indicative of a reduction of the interfacial trap densities. Mobility studies at low temperature have been carried out, which indicated that the activat… Show more

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Cited by 58 publications
(38 citation statements)
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“…[12][13][14] a-ZTO possess the same overlapping s-orbital dominated dispersed conduction band structure as a-IGZO 15 leading to a high mobility and conductivity, that is maintained even in absence of a crystal structure. a-ZTO has already been utilised in laboratory scale thin film transistors, 11,[16][17][18] photovolatic cells, 19 gas sensing, 20 transport channels in metal-semiconductor-field-effect-transistors 21,22 and organic light-emitting diodes (OLEDs). 13,23 a-ZTO has been grown by a variety of physical vapour deposition (PVD) methods including magnetron sputtering, 11,13,24 pulsed laser deposition 25 and some chemical methods.…”
Section: Introductionmentioning
confidence: 99%
“…[12][13][14] a-ZTO possess the same overlapping s-orbital dominated dispersed conduction band structure as a-IGZO 15 leading to a high mobility and conductivity, that is maintained even in absence of a crystal structure. a-ZTO has already been utilised in laboratory scale thin film transistors, 11,[16][17][18] photovolatic cells, 19 gas sensing, 20 transport channels in metal-semiconductor-field-effect-transistors 21,22 and organic light-emitting diodes (OLEDs). 13,23 a-ZTO has been grown by a variety of physical vapour deposition (PVD) methods including magnetron sputtering, 11,13,24 pulsed laser deposition 25 and some chemical methods.…”
Section: Introductionmentioning
confidence: 99%
“…As shown in Figure a, the nanocrystalline‐CdS (nc‐CdS) film revealed poor field‐effect mobility ( µ FE,CdS = 0.05 cm 2 V −1 s −1 ) and large threshold voltage shift in hysteresis loop (Δ V Th, Hys = 10.0 V) owing to numerous defective sites at the interface/surface of the nc‐CdS film and grain boundaries. In contrast, Sn‐eqi amorphous ZTO semiconductor (Sn‐eqi a‐ZTO) exhibited high‐performance carrier transport behavior ( µ FE, Sn‐eqi a‐ZTO = 2.5 cm 2 V −1 s −1 ) and low charge trap density‐induced narrow hysteresis loop (Δ V Th, Hys = 1.2 V) in the dark state owing to Sn‐induced effective conduction pathway, grain‐boundary‐free amorphous phase, and low Vo concentration . However, the wide optical bandgap (λ ZTO, bandgap = 335 nm) of Sn‐eqi a‐ZTO film causes direct band‐to‐band absorption of UV‐level spectral photons and introduces highly transparent optical properties over most spectral ranges of visible light (Figure b).…”
Section: Resultsmentioning
confidence: 99%
“…However, alternative semiconductor materials that rely on abundant and non-toxic elements are required due to environmental demands. Zinc-tin-oxide (ZTO) is a promising indium and gallium-free alternative and impressive results have already been obtained in TFTs applications [19,20].…”
Section: Amorphous Semiconductor Oxidesmentioning
confidence: 99%