2019
DOI: 10.1016/j.jallcom.2019.02.076
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Tuning electrical conductivity of β-Ga2O3 single crystals by Ta doping

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Cited by 54 publications
(30 citation statements)
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“…Secondary Ion Mass spectroscopy (SIMS), was not possible to quantify Hf concentration due to the lack of standards, but the Hf existence has been confirmed with energy dispersive x-ray spectroscopy (EDS) in our Hf doped samples as shown in the Supplementary Material. Finally, GDMS on the Hf-doped samples has been conducted and is shown in the Supplementary Materials; the GDMS results show Hf of 1.3x10 19 atoms/cm 3 which is close to the measured n and confirm the incorporation of Hf, and show Si, Zr, and Fe to be 2.5x10 17 atoms/cm 3 , 2.1x10 17 atoms/cm 3 , and 8.3x10 16 atoms/cm 3 , respectively. Sn and Ge were below the detection limits.…”
Section: Resultssupporting
confidence: 58%
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“…Secondary Ion Mass spectroscopy (SIMS), was not possible to quantify Hf concentration due to the lack of standards, but the Hf existence has been confirmed with energy dispersive x-ray spectroscopy (EDS) in our Hf doped samples as shown in the Supplementary Material. Finally, GDMS on the Hf-doped samples has been conducted and is shown in the Supplementary Materials; the GDMS results show Hf of 1.3x10 19 atoms/cm 3 which is close to the measured n and confirm the incorporation of Hf, and show Si, Zr, and Fe to be 2.5x10 17 atoms/cm 3 , 2.1x10 17 atoms/cm 3 , and 8.3x10 16 atoms/cm 3 , respectively. Sn and Ge were below the detection limits.…”
Section: Resultssupporting
confidence: 58%
“…Hall measurements on twelve Hf-doped samples obtained from different locations from the same boule show the electron concentration at room temperature (n) to vary between 7.5x10 18 cm -3 to 1.9x10 19 cm -3 and resistivity between 12.5mΩ-cm to 5.2mΩ-cm; eight of the Hf-doped samples are shown as example in Table 1. The variation shows that n, and in-turn the Hf concentration, increases vertically toward the bottom of the boule indicating a segregation coefficient of less than 1, and decreases radially toward the edges of the boule indicating a possible convex solid/liquid interface; this interface increases the tendency of spiral growth, and the interface is also typical for highly doped and conductive β-Ga2O3 due to free carrier absorption.…”
Section: Resultsmentioning
confidence: 99%
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“…To our knowledge, the lowest FWHM reported is ~22 arcsec for the peak β -Ga 2 O 3 (400) by Hossain et al [ 39 ], in this work, the Laue diffraction patterns also confirmed that the grown β -Ga 2 O 3 crystal has a good crystallinity. However, FWHM of β -Ga 2 O 3 rocking curves larger than 100 arcsec has also been measured [ 38 , 53 ]. However, both these techniques mentioned above suffer from small crystal size (wafer is no more than 1 inch so far, as summarized in Table 1 .…”
Section: Gallium Oxide (Ga 2 O 3 )mentioning
confidence: 99%
“…for effective n-type doping. [27][28][29][30][31] V is typically doped into TiO 2 for photocatalytic research. 32,33 Considering the ionic radius, the radius of V 5+ (0.059 nm) is nearly the same as that of Ga 3+ (0.062 nm), and V slightly changes the lattice size of β-Ga 2 O 3 single crystals.…”
Section: Introductionmentioning
confidence: 99%