2020
DOI: 10.1021/acs.nanolett.9b05247
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Tuning Electrical Conductance of MoS2 Monolayers through Substitutional Doping

Abstract: Tuning electrical conductivity of semiconducting materials through substitutional doping is crucial for fabricating functional devices. This, however, has not been fully realized in two-dimensional (2D) materials due to the difficulty of homogeneously controlling the dopant concentrations and the lack of systematic study of the net impact of substitutional dopants separate from that of the unintentional doping from the device fabrication processes. Here, we grow wafer-scale, continuous MoS2 monolayers with tun… Show more

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Cited by 113 publications
(141 citation statements)
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“…[ 64 ] As the thickness of Re‐WSe 2 approaches monolayer level, the dielectric screening is reduced ultimately resulting in stronger Coulomb interaction between the donor nucleus and electron with higher E b . [ 37,54,64 ] Previous reports indeed demonstrate an increase in electron concentration in bulk Re‐WSe 2 whereas FEOL Re‐WSe 2 is monolayer in nature which further supports our hypothesis. [ 33 ] Conventional, external dopant activation techniques such as high‐temperature and laser‐annealing methods can be used to ionize deep level dopants in extrinsic 2D TMDCs.…”
Section: Figuresupporting
confidence: 89%
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“…[ 64 ] As the thickness of Re‐WSe 2 approaches monolayer level, the dielectric screening is reduced ultimately resulting in stronger Coulomb interaction between the donor nucleus and electron with higher E b . [ 37,54,64 ] Previous reports indeed demonstrate an increase in electron concentration in bulk Re‐WSe 2 whereas FEOL Re‐WSe 2 is monolayer in nature which further supports our hypothesis. [ 33 ] Conventional, external dopant activation techniques such as high‐temperature and laser‐annealing methods can be used to ionize deep level dopants in extrinsic 2D TMDCs.…”
Section: Figuresupporting
confidence: 89%
“…The superior tunability of optical and transport properties as a function of doping concentration and environmental stability are demonstrated in such monolayer films. [ 36–40 ] However, tight control over the doping concentration and fundamental understanding behind homogenous dopant distribution over large areas still remain a challenge.…”
Section: Figurementioning
confidence: 99%
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“…Surprisingly, μ FE can be significantly improved by moderate doping, e.g., from 30 cm 2 V -1 s -1 at F O2 = 4 sccm (which is close to an intrinsic case), to 70 cm 2 V -1 s -1 at F O2 = 6 sccm, and a maximum value of 105 cm 2 V -1 s -1 can be achieved at F O2 = 10 sccm (Figures S17-S21, Supporting Information, for detailed electrical analysis). As the highly conductive phase of MoS 2-x O x from O S substitutional doping could be formed into MoS 2 lattice, [9,14] the electronic behavior of doped MoS 2 films could be modulated, and the sheet conductance and associated field effect mobility (μ FE ) could be enhanced with appropriate doping levels (F O2 ≤ 10 sccm) as shown in Figure 5e and Figure S22 (Supporting Information). At heavy doping levels (F O2 ≥ 20 sccm), the defects and visible damages (Figure 1g) prone to form on the MoS 2-x O x basal plane and serve as the main carrier scattering centers, thus degrading its electronic quality.…”
Section: Resultsmentioning
confidence: 99%
“…The 2D homojunctions can be (1) thicknessbased junctions, 22 (2) elemental doping based junctions, 5,28 (3) electrostatically doped junctions, 11,15,29,30 and (4) chemically doped junctions, in which there is surface chemical doping or substitutional doping of a region in a 2D material. 16,[31][32][33][34][35] In particular, 2D lateral pn junctions (2DJ) are useful for solar cells and photodetectors because the built-in potential created in the extended space charge region separates and drives the photogenerated e-h pairs to generate photocurrent. [25][26][27] While there are many reports of experimental studies on 2D junctions, the same is not true for theoretical studies, where the impact of low dimensionality on their electrical properties and their differences with 3D junctions (3DJs) are reported.…”
Section: Introductionmentioning
confidence: 99%