2014
DOI: 10.1016/j.matchar.2014.01.008
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Triple ion beam cutting of diamond/Al composites for interface characterization

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Cited by 17 publications
(8 citation statements)
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“…Although chemical and electrochemical etching methods can reveal certain interfacial reaction products like Al 4 C 3 by extracting the Al matrix [19], they cannot reserve true interfacial states and terribly wash off nanoscale interfacial features without strong bonding with the diamond surface. To overcome these problems, a triple ion beam (TIB) cutting technique has been successfully applied to acquire a flat surface without additional artifacts [20].…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…Although chemical and electrochemical etching methods can reveal certain interfacial reaction products like Al 4 C 3 by extracting the Al matrix [19], they cannot reserve true interfacial states and terribly wash off nanoscale interfacial features without strong bonding with the diamond surface. To overcome these problems, a triple ion beam (TIB) cutting technique has been successfully applied to acquire a flat surface without additional artifacts [20].…”
Section: Introductionmentioning
confidence: 99%
“…Hence, in this work in-depth interfacial characterization of the SPSed and VHPed diamond (40 and 50 vol.%)/Al composites has been carried out at length scales from the macro to nanoscale in order to evaluate the feasibility of SPS and VHP techniques to tailor such a bonding state. The TIB technique has been used to prepare nearly-perfect surface of samples to make true interfacial characterization possible at the micrometer scale and facilitate site-specific sample preparation by focus ion beam (FIB) [20]. Special attention has been paid to shedding light on the effect of thermal gradients spontaneously generated during the SPS process on interfacial configurations and bonding states of the diamond/Al composites.…”
Section: Introductionmentioning
confidence: 99%
“…A clean and smooth surface of the sample without introducing artefacts like scratches is nearly impossible using abrasive diamond suspensions or polishing pads. This is especially the case, if a specimen contains minerals of different hardness [8] or is embedded in resin [9]. During mechanical polishing, the softer material (e.g.…”
Section: Introductionmentioning
confidence: 99%
“…Just as Ji et al [19] mentioned, it is almost impossible to obtain an even surface at a metal/diamond interface by using FIB only. As a significant modification, they employed triple ion beam (TIB) to firstly polish the sample surface and then cut to TEM foils by using FIB.…”
Section: Introductionmentioning
confidence: 99%
“…As a significant modification, they employed triple ion beam (TIB) to firstly polish the sample surface and then cut to TEM foils by using FIB. This novel route has been demonstrated in the preparation of TEM foils for Al/diamond composites [19]. Also, the diamond particles can be extracted from the Cu/diamond composites by dissolving the Cu matrix in a solution [20], enabling the investigation of the Ti coating on the diamond particles.…”
Section: Introductionmentioning
confidence: 99%