Trends in VLSI technologies

Zimmer, G.; Vogt, H.; Lackmann, R.

doi:10.1016/0167-9317(90)90010-q

Cited by 3 publications

(2 citation statements)

References 6 publications

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“…Microfluidics originated in the 1980s, a concept that stemmed from the development of a fully automatic analytical measuring station on the factory floor with the aim of miniaturizing large equipment. 17,18 The rise of this technology is related to the development of lithography on silicon and integrated circuit technology. 18 In 1990, ''Microchemical Full Analysis System'' from Swiss scientist Andreas Manz clarified the concept of micro and full, marking the opening of the era of microfluidic.…”

Section: Microfluidics For Detection Of Cvd Markersmentioning

confidence: 99%

“…17,18 The rise of this technology is related to the development of lithography on silicon and integrated circuit technology. 18 In 1990, ''Microchemical Full Analysis System'' from Swiss scientist Andreas Manz clarified the concept of micro and full, marking the opening of the era of microfluidic. 19 With the development of materials science, the emergence of polydimethylsiloxane (PDMS) revolutionized microfluidic devices and brought microfluidics into a booming era.…”

Section: Microfluidics For Detection Of Cvd Markersmentioning

confidence: 99%

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Microfluidics for diagnosis and treatment of cardiovascular disease

Liu

Cao

et al. 2023

J. Mater. Chem. B

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Section: Microfluidics For Detection Of Cvd Markersmentioning

confidence: 99%

Section: Microfluidics For Detection Of Cvd Markersmentioning

confidence: 99%

Microfluidics for diagnosis and treatment of cardiovascular disease

Liu

Cao

et al. 2023

J. Mater. Chem. B

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Electron beam testing

Wolfgang

Görlich

Kölzer

1991

Quality & Reliability Eng

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Electron-beam testing (EBT) is currently used at two stages in the development and manufacture of integrated circuits (ICs), namely for chip verification and failure analysis. These are explained with the aid of two examples. EBT is, however, only one of many diagnostic tools. In order to classify it more usefully, a scenario is described that takes account of trends in chip development and packaging, and the linking of EBT with CAD (computer-aided design) and CAT (computer-aided testing). The conclusion is reached that EBT will remain an indispensable diagnostic tool. In future, it will probably be used under increasingly more' difficult conditions, however, due primarily to the greater complexity of specimen preparation and test stimuli generation.

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