1976
DOI: 10.1088/0022-3727/9/13/008
|View full text |Cite
|
Sign up to set email alerts
|

Trap distribution in ZnIn2S4from photoconductivity analysis

Abstract: Photoconductivity, quenching, thermally stimulated current and decay characteristics are studied in ZnIn2S4 single crystals. Evidence is obtained for the presence of three impurity levels taking part in the photoconductivity process. Optical quenching is attributed to a sensitization centre, which acts as a competitive recombination level. An exponential distribution of electron traps is revealed both by pulsed photoconductivity and by thermocurrent analysis. The two experimental techniques accordingly provide… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

10
30
0

Year Published

1977
1977
2018
2018

Publication Types

Select...
9

Relationship

0
9

Authors

Journals

citations
Cited by 64 publications
(40 citation statements)
references
References 24 publications
(21 reference statements)
10
30
0
Order By: Relevance
“…With regard to the synthesized layer using the x = 0.4, the value of the forbidden band is 2.8 eV. This value is in the same range with the one found by Serpi [6] in a photoconductivity study of thin layers of the same ternary compound.…”
Section: Optical Propertiessupporting
confidence: 83%
“…With regard to the synthesized layer using the x = 0.4, the value of the forbidden band is 2.8 eV. This value is in the same range with the one found by Serpi [6] in a photoconductivity study of thin layers of the same ternary compound.…”
Section: Optical Propertiessupporting
confidence: 83%
“…The spectra decreased in intensity and shifted towards higher temperatures with increasing the light excitation temperature. This shift supports the validity of a quasi-continuous trap distribution [27][28][29][30]. Each TSC spectra obtained at different excitation temperatures can be described by the following expression [27]:…”
Section: Initial Rise Methodssupporting
confidence: 72%
“…By assuming an exponential traps distribution, whose density at energy E t will be given by N = A 1 exp(−αE t ), we can write for the traps filled at the excitation temperature T 0 the following expression [27]:…”
Section: Determination Of the Traps Distributionmentioning
confidence: 99%
“…Native defects such as various traps having energy in the range 0⋅15-0⋅8 eV (Kindleysides and Woods 1970;Kalita et al 1999) can cause considerable change in the electrical and optical properties of semiconductor thin films. These defects characterize the electronic properties of the materials, because they give rise to charge centre acting as donors and acceptors (Serpi 1976). In view of the lack of information concerning the effect of illumination on trapping spectrum in thermally evaporated CdSe thin films, in this paper an assessment has been made regarding the influence of illumination on mobility activation process as well as on the evaluation of trap depths at different ambient conditions.…”
Section: Introductionmentioning
confidence: 99%