Transmitted scattered light from a thin film with shallow random rough interfaces

Abstract

The transmitted scattered energy of plane electromagnetic waves from a thin metallic film with shallow rough interfaces bounded by two semi-infinite media is calculated. Both interfaces are modeled as independent stationary random processes with a Gaussian roughness spectrum. Scattering of light is calculated for both TM (p) or TE (s) polarizations for normal and oblique angles of incidence. An integral equation is obtained for the transmitted field based on the Rayleigh method and their solution involves Fourier coefficients, depending on the roughness profiles. We present some results for the case of a single thin metallic film in the attenuated total reflection configuration for s and p polarization around the angle of the excitation of surface-plasma waves θ(sp). The transmitted scattered intensity shows a maximum at the resonant angle θ(sp) in the case of p polarization.

Polarized laser light scattering applied to surface morphology characterization of epitaxial III–V semiconductor layers

“…It can be seen that the measured light anisotropy does not imply significant dif-FIG. 10. ͑a͒ 2D power spectral density ͑PSD͒ for sample C calculated from the angle-resolved light scattering ͑ARLS͒ data at two angles of incidence shown in Fig.…”

“…1-3, and references therein͒; similar proportionality has been found in the case of a rough film on a planar substrate with different dielectric permittivities, 4-8 and even for multilayer structures. 9,10 The criteria for the applicability of such perturbation-theoretical expressions 1,2,11 for the typical surface roughness developed during epitaxial growth are, in most cases, fulfilled as a result of the high smoothness of the surfaces thus generated. This allows us to use the LLS technique for viewing and studying surface features as small as tenths of nanometer in height and with lateral dimensions larger than /2 ͑Rayleigh limit͒.…”

Effects of surface roughness on optical properties and sensitivity of fiber-optic evanescent wave sensors

“…On the other hand, for surface plasmon resonance sensors, Herrera et al [23] discovered that the stability of the modified film on the unclad fibers and the sensor performance increase with the surface roughness. Also, some enhancements are studied by using the Rayleigh method for the transmitted scattered intensity for weakly random rough surfaces in the resonance condition in which surface plasmon waves are excited for p polarization [24], and many glucose sensors are developed [25]. However, a few papers reported that the characteristics of the surface roughness (pit depth and diameter) affect the optical transmission properties and sensitivity of the sensors, and discussed how to further improve the sensitivity of FOEW sensors with rough surfaces.…”