2018
DOI: 10.1103/physrevb.97.134515
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Transmission x-ray microscopy at low temperatures: Irregular supercurrent flow at small length scales

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Cited by 12 publications
(19 citation statements)
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“…This approach has been successfully applied recently [30] but it restricts the lateral dimensions of the sample to a few microns and it also limits the means for successive nanofabrication. An approach allowing for more general sample designs is utilizing a combination of mechanical grinding and FIB milling to create local areas of soft x-ray transparency in an extended bulk substrate [31,32]. By adopting this approach to TR-STXM, spin waves in an extended YIG thin film have been recorded with the main focus being on the excitation and imaging of spin waves with wavelengths below 250 nm.…”
Section: Introductionmentioning
confidence: 99%
“…This approach has been successfully applied recently [30] but it restricts the lateral dimensions of the sample to a few microns and it also limits the means for successive nanofabrication. An approach allowing for more general sample designs is utilizing a combination of mechanical grinding and FIB milling to create local areas of soft x-ray transparency in an extended bulk substrate [31,32]. By adopting this approach to TR-STXM, spin waves in an extended YIG thin film have been recorded with the main focus being on the excitation and imaging of spin waves with wavelengths below 250 nm.…”
Section: Introductionmentioning
confidence: 99%
“…The XMCD technique has also been used for the investigation of recording of magnetic flux patterns in YBCO in an adjacent Permalloy sensor layer [79,80]. Figure 9a shows a schematic of a heterostructure investigated by transmission X-ray microscopy, which consists of the layer of interest, i.e., optimally doped YBCO film epitaxially grown on single crystalline SrTiO 3 (001) (STO) with Py as a sensor layer on top.…”
Section: Imprinting Of Inhomogeneous Magnetic Landscapes In Permalloymentioning
confidence: 99%
“…Another approach to fabricate soft X-ray transparent samples is to use focused gallium ion beam (Ga FIB) milling in combination with mechanical grinding to remove substrate material until the samples are transparent in the soft X-ray regime [13][14][15][16][17][18]. While this technique marks an important milestone for X-ray transmission experiments, it is at the same time severely limited by the relatively low milling speed of the Ga FIBs used.…”
Section: Introductionmentioning
confidence: 99%