2006
DOI: 10.1016/j.jcrysgro.2005.12.108
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Transmission electron microscopy study of defect reduction in two-step lateral epitaxial overgrown nonplanar GaN substrate templates

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Cited by 11 publications
(6 citation statements)
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“…During the second step LEO, on the contrary, the growth rate of f1 12 2g facets will be increased much relative to that of the (0 0 0 1) facet, until a smooth coalescence is achieved [20]. The detailed procedures for twostep LEO were presented elsewhere [24].…”
Section: Methodsmentioning
confidence: 99%
“…During the second step LEO, on the contrary, the growth rate of f1 12 2g facets will be increased much relative to that of the (0 0 0 1) facet, until a smooth coalescence is achieved [20]. The detailed procedures for twostep LEO were presented elsewhere [24].…”
Section: Methodsmentioning
confidence: 99%
“…These TDs could provide leakage pathways for electron-hole pairs to pass through active region [7]. In addition, as compared with the device B, better crystalline quality of the device C might be attributed the higher roughness of nanocomb-shaped PSS, which could result in more bending and annihilation of TDs [24]. Thus, the presence of TDs could be suppressed more validly.…”
Section: B Steady-state Of Pore Growthmentioning
confidence: 99%
“…Non‐polar and semi‐polar GaN can be grown on large and cost effective foreign substrates but usually these films suffer from high density of dislocations . Micron scale structures grown by selective area growth (SAG) on c ‐plane GaN have facets that correspond to some low index semi‐polar and non‐polar surface planes, but they suffer from threading dislocations penetrating from the selective area growth window regions to the surface, thereby degrading the crystal quality . A recent study on nanostructures grown by SAG exhibit highly efficient dislocation filtering mechanisms .…”
Section: Introductionmentioning
confidence: 99%