1982
DOI: 10.1109/t-ed.1982.20668
|View full text |Cite
|
Sign up to set email alerts
|

Transition metal-gate MOS gaseous detectors

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2

Citation Types

1
13
0

Year Published

1983
1983
2020
2020

Publication Types

Select...
5
3
2

Relationship

0
10

Authors

Journals

citations
Cited by 88 publications
(14 citation statements)
references
References 9 publications
1
13
0
Order By: Relevance
“…On the other hand, it is reported that voltage shifts in C-V characteristics in Pd-metal oxide semiconductor (MOS) structure on p-Si show negative values in the presence of hydrogen at 473 K [ 2 ], suggesting that the Pd work function apparently decreases. Similar voltage shifts of the C-V characteristics in Pd-MOS structure upon hydrogen exposure were observed even at 293 K [ 6 ]. These results seem not to be consistent with literatures which report that the Pd work function increases unless at quite low temperatures, implying that the change in the Pd work function is not the dominant factor for hydrogen sensitivity.…”
Section: Introductionsupporting
confidence: 56%
“…On the other hand, it is reported that voltage shifts in C-V characteristics in Pd-metal oxide semiconductor (MOS) structure on p-Si show negative values in the presence of hydrogen at 473 K [ 2 ], suggesting that the Pd work function apparently decreases. Similar voltage shifts of the C-V characteristics in Pd-MOS structure upon hydrogen exposure were observed even at 293 K [ 6 ]. These results seem not to be consistent with literatures which report that the Pd work function increases unless at quite low temperatures, implying that the change in the Pd work function is not the dominant factor for hydrogen sensitivity.…”
Section: Introductionsupporting
confidence: 56%
“…A shift in the threshold voltage is therefore correlated to the modulation of the work function at the semiconductor-insulator interface induced by the adsorption of the polar molecules. The threshold voltage change can be estimated according to the Poisson equation [47,48]. Oxidizing molecules such as nitrogen dioxide and 2,4-dinitrotoluene, on the other hand, enhance the hole charge density, shifting the threshold voltage in positive direction [31,44].…”
Section: Resultsmentioning
confidence: 99%
“…In fact, V th shifts in a negative direction after N 2 O exposure. The consequent change in voltage across the dipole layer can be solved using Poisson's equation, the result of which is given by [15,16] …”
Section: Resultsmentioning
confidence: 99%