2013
DOI: 10.1063/1.4820449
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Transistor operation and mobility enhancement in top-gated LaAlO3/SrTiO3 heterostructures

Abstract: @@@@@@@@@@@@@@@@ @@@@@@@@@@@@@@@@@@ @@@@@@@@@@@@@@@@@ €€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€ @@@@@@@@@@@@@@@@@€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€ @@@@@@@@@@@@@@@@@@@@@@@€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€ @@@@@@@@@@@@@@@@@@@@@@@ €€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€€ ĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀĀ

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Cited by 76 publications
(101 citation statements)
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References 23 publications
(34 reference statements)
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“…These dynamic techniques include using a conducting atomic force microscope, 12 top gating through the LAO film, 43,44 and using polar solvents. 12,45 One simple fact links these dynamic techniques: they work by modifying the electrostatic potential from the LAO side of the interface.…”
Section: 4647mentioning
confidence: 99%
“…These dynamic techniques include using a conducting atomic force microscope, 12 top gating through the LAO film, 43,44 and using polar solvents. 12,45 One simple fact links these dynamic techniques: they work by modifying the electrostatic potential from the LAO side of the interface.…”
Section: 4647mentioning
confidence: 99%
“…It is therefore somewhat surprising that a similar strategy has not been adopted to investigate confinement at oxide interfaces thus far. Large area top gated devices have indeed been fabricated using a variety of techniques such as sputtering [24], evaporation [25,26] and in-situ deposition [27,28]. However scaling these structures down has remained a challenge.…”
mentioning
confidence: 99%
“…The concept of our dual-gate devices is to control the interface and bulk boundary conditions of the asymmetric quantum well via the top 25 and back 6,26 gates, respectively 9,27 . As sketched in Figure 1a, with decreasing top gate voltage (V TG ) at fixed zero back gate voltage (V BG ), the electric field at the interface becomes weaker and the electron envelope wavefunction is pushed away from the interface and its associated scattering, resulting in an increase of the mobility.…”
mentioning
confidence: 99%