Transient IR-Drop Analysis for At-Speed Testing Using Representative Random Walk

IGS: The Novel Fast IC Power Ground Network Optimization Flow Based on Improved Gauss-Seidel Method

“…And the Representative Random Walk algorithm presented in [14] establishes a relatively simple conductance model according to the width and density of the real PGN, then calculates the IR-drop distribution of the model, which is efficient to estimate the IR-drop distribution. But this algorithm cannot get accurate IR-drop distribution and calculate the voltage of each node in PGN.…”

Test Pattern Modification for Average IR-Drop Reduction

“…To reduce the walk length, representative random walk is used to improve the runtime in this paper [17].…”

“…The technique of representative random walk reduces the original power grid network to a representative network that contains only the representative nodes and edges between them [17]. Solving the voltage of representative nodes in the representative network is faster than solving the voltage of all nodes in the original network because the former is much smaller than the latter.…”

“…1(a)-(c) shows the maximum time-averaged IR drop versus FFTC, WSA, and our proposed fast average IR drop (FAIR), respectively. Because transient IR-drop simulation for each test pattern is time consuming, we used our random walk simulator (<10% error compared with a commercial tool) [17]. We obtained the time-averaged value of transient IR drop of each node.…”

“…To avoid fault coverage loss, fault-detecting care bits are kept unchanged. We have implemented the proposed technique using a randomwalk-based IR-drop simulator [17]. Fig.…”